Design of multiprobe devices for electronic components with ball leads testing

Abstract

Developed commutative board with ZIF connectors allows realizing multiprobe device connection to automated measuring systems, providing also the possibility of its future application to test other electronic components with more leads. Also the results of experimental and modeling research of developed device prototype are presented and explained. Obtained results substantiate the basic requirements for the multiprobe connecting device that should be observed during its contacting to the unit under test. Designed test fixture is more simple and cheap in comparison with its analogues. Also developed method of testing effectively provides the necessary contact pressure between test fixture and unit under test without hazard of its deformation which can appear in similar devices.