Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

“…UE to manufacturing process variability, faults are inevitable in integrated circuit (IC) fabrication [1]. The faults in IC can mix with the system intrinsic faults [2]- [4] to make fault detection more complicated and costly [5]- [7].…”