Design of TEM cell and high sensitive probe for EMI analysis of built-in Webcam module

Design and application of a mobile miniature current probe for analysing the cause of EMI noise in IC circuits

“…The noise measurement results show that the 125 MHz harmonic is the primary source of noise on the digital circuit board. There are actual case studies of this phenomenon in [3,15]. When there is built-in base frequency in the function module of mobile device, such as the harmonic frequencies of USB 48 MHz, LVDS 65 MH, and LAN chip 25 MHz, EMI noise interference with mobile communication bands have been detected, and this result is consistent with the references.…”

“…The material would not bend easily and would not experience probe tip deformation after repeated testing. The internal structure of the probe was also designed with good shielding effects, keeping it free from the surrounding environment EMI [15]. We have proposed three simulation structures.…”

“…The improved probe would be able to directly contact the IC pins without the need for SMA connectors, allowing better convenience and reducing the component costs required for IC EMI noise measurement. To ensure the practicability of this probe, the EMI noise measurement methods proposed in [1,2,15] were adopted, which include two methods of noise measurement based on TEM_cell and magnetic probes. Simultaneously, the far-field measurement of CISPR 22 [16] has also been introduced, and the results of these three measurement methods are compared with the noise frequencies and levels obtained by this probe to find mutual correlation to verify the commercial reference value of noise obtained by this probe.…”