Design, performance, and utilization of the Low-Energy X-ray Reflectometer at DTU space

Henriksen, Peter L.; Christensen, Finn Erland; Massahi, Sonny; Ferreira, Desiree Della Monica; Svendsen, Sara; Gellert, Nis C.; Jegers, Arne S.; Sokolov, Andréy; Shortt, Brian

doi:10.1117/1.jatis.7.4.048004

Cited by 2 publications

(1 citation statement)

References 22 publications

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“…The Low-Energy X-ray Reflectometer (LEXR) is a custom-built system for DTU Space by JJ X-ray, which operates under high vacuum (p < 10 −5 mbar) and uses an aluminium source with Kα 1 emission at 1.487 keV with an angular resolution of 7 millidegrees. It was installed and commissioned by the end of 2019 21 .…”

Section: Xrr At 1487 Kev In Lexr Dtu Spacementioning

confidence: 99%

Characterization of carbon thin films as an overcoating candidate material for the optics of NewATHENA

Paredes Sanz,

Svendsen,

Massahi

et al. 2023

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI

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The NewATHENA mission has been chosen by ESA to cover the topic of "The hot and energetic Universe". This will be carried out by studying the X-ray Universe with a space-based telescope to be launched in the second half of 2030s.Several materials have been considered as overcoating candidates for the Silicon-Pore Optics (SPO) mirror plates developed for NewATHENA. Previously, carbon did not qualify as an overcoating material since it was not compatible with the manufacturing processes. However, new coatings made in the dedicated chamber for NewATHENA located at cosine Research BV, together with an improvement on the selected cleaning procedure, have shown that carbon is now compatible with the process. This work covers the characterization of the mirror coatings for NewATHENA following a complete and representative wet chemistry process. The primary focus is on the overcoating carbon layer and the hybridisation of the atomic orbitals within its constituent atoms. For the characterization we used X-ray reflectometry (XRR) and X-ray photoelectron spectroscopy (XPS) techniques. We performed θ − 2θ reflectivity measurements at fixed energies of 1.487 keV and 8.048 keV, and at a fixed incident angle of 0.6 • from 3.4 to 10.0 keV. We performed angle resolved XPS (ARXPS) measurements with an energy of 1.487 keV.We found that both techniques are in agreement showing an sp 3 -content on the samples around 20%, indicating a certain level of diamond-likeness. Although it remains unclear if this is the reason for the compatibility of carbon with the manufacturing process, our work shows that the species of carbon grown in the film are able to ensure a good stability of the mirror.

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Section: Xrr At 1487 Kev In Lexr Dtu Spacementioning

confidence: 99%

Characterization of carbon thin films as an overcoating candidate material for the optics of NewATHENA

Paredes Sanz,

Svendsen,

Massahi

et al. 2023

Optics for EUV, X-Ray, and Gamma-Ray Astronomy XI

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Assessing substrate quality and contamination of thin film coatings for x-ray optics

Paredes Sanz,

Massahi,

Svendsen

et al. 2024

Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray

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This work investigates the importance of substrate quality and contamination of thin film coatings, essential for high-energy reflective mirrors used in astronomical missions and other applications, focusing on the manufacturing process from substrate selection to final assembly of the optics. Characterization of thin film coatings is crucial for evaluating the performance of X-ray mirrors. Multifaceted and synergized methodologies utilizing Xray reflectometry (XRR), X-ray photoelectron spectroscopy (XPS) and optical microscopy (OM) are presented. Herein, we discuss coating performance, encompassing substrate preparation, coating deposition, and storage conditions.XRR scans provide detailed insights into thin film properties, however, the dependence on accurate a priori knowledge necessitates a robust model for solving the inverse problem. Addressing this limitation, XPS proves invaluable in revealing the chemical composition of thin films, improving the accuracy of the XRR model. Combined characterization through OM and XRR is very useful to find visual insights into surface contaminationinduced changes when mirrors are stored for long periods in a clean room environment, as might be the case for some astronomical missions. The synergy among these techniques is pivotal for evaluating coating quality for high-energy astronomical telescopes, with a specific focus on NewAthena and upcoming missions. This research not only advances methodologies in this field but also highlights the collaborative power of XRR, XPS, and OM in providing a comprehensive understanding of thin film coatings, emphasizing the importance of pre-coating mirror quality and mitigating contamination effects throughout the optics production process to ensure optimal performance.

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Design, performance, and utilization of the Low-Energy X-ray Reflectometer at DTU space

Cited by 2 publications

References 22 publications

Characterization of carbon thin films as an overcoating candidate material for the optics of NewATHENA

Characterization of carbon thin films as an overcoating candidate material for the optics of NewATHENA

Assessing substrate quality and contamination of thin film coatings for x-ray optics

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