DOI: 10.15368/theses.2010.1
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Design techniques to improve time dependent dielectric breakdown based failure for CMOS circuits

Abstract: ii Analysis of the data from the software infrastructure showed that transistor sizing played a role in the MTTF. To maximize the MTTF of a transistor in a CMOS inverter, the activity of the pull-up transistor should be balanced with the transistor in the pulldown chain, ensuring the electric fields are balanced across both transistors. While it is impossible to completely balance an arbitrary CMOS circuit's activity for an arbitrary set of input signals, circuits can be intelligently skewed to help maximize t… Show more

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