Designing an accelerated degradation test plan considering the gamma degradation process with multi-stress factors and interaction effects

Limon, Shah; Rezaei, Esmaeil; Yadav, Om Prakash

doi:10.1080/16843703.2019.1696010

Cited by 21 publications

(12 citation statements)

References 20 publications

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“…The prescribed accuracy level is a statistical concept that relates to the accuracy of estimations. Several studies (Limon et al, 2020; Tsai et al, 2016; Tseng et al, 2009) have developed optimal integer designs while considering a cost constraint. However, the optimal design obtained within a cost constraint may not achieve the desired accuracy level.…”

Section: Optimal Designsmentioning

confidence: 99%

“…They assumed predetermined stress levels and used a grid search algorithm to obtain a

V

‐optimal design under a cost constraint (budgets). Limon et al (2020) proposed a

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‐optimal design for a multistress and interaction effects model. They employed a heuristic‐based genetic algorithm to identify the optimal design within a given cost constraint.…”

Section: Introductionmentioning

confidence: 99%

“…Additionally, Tsai et al (2016) assumed known stress levels, which is not usually the case in practical scenarios. Similarly, Limon et al (2020) assumed equal termination times for testing at each stress level, whereas higher stress levels typically require shorter testing times. Tung and Tseng (2019) considered a generalized Eyring model to the drift parameter of the gamma process, and analytically showed that the

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‐optimal approximate design only allocates test units at four stress levels.…”

Section: Introductionmentioning

confidence: 99%

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Optimizing two‐variable gamma accelerated degradation tests with a semi‐analytical approach

Tung

2023

Naval Research Logistics

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In this paper, we provide a semi‐analytical approach to determine the optimal designs for two‐variable gamma accelerated degradation tests under three criteria: ‐optimality, ‐optimality, and ‐optimality. We first use general equivalence theorem to prove that the optimal approximate designs only allocate test units at the four vertices of a rectangular design region, and the corresponding optimal proportion of total number of measurements at each stress level is derived. Next, we apply the concept of prescribed accuracy level and total experimental cost to further determine optimal integer designs. More specifically, a numerical approach is used to resolve the number of test units and number of measurements at each stress level. Finally, an example is presented to illustrate the proposed procedure and compare the efficiency of optimal designs under three optimal criteria.

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Section: Optimal Designsmentioning

confidence: 99%

“…They assumed predetermined stress levels and used a grid search algorithm to obtain a

V

‐optimal design under a cost constraint (budgets). Limon et al (2020) proposed a

V

‐optimal design for a multistress and interaction effects model. They employed a heuristic‐based genetic algorithm to identify the optimal design within a given cost constraint.…”

Section: Introductionmentioning

confidence: 99%

V

‐optimal approximate design only allocates test units at four stress levels.…”

Section: Introductionmentioning

confidence: 99%

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Optimizing two‐variable gamma accelerated degradation tests with a semi‐analytical approach

Tung

2023

Naval Research Logistics

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“…Improper use of these PCI‐based sampling methods might lead to misjudgments in applications. According to Epstein and Sobel, 15 Meyer, 16 Anderson et al., 17 Keller et al., 18 Abd and Hassanein, 19 Chakrabarty et al., 20 Johnen et al., 21 Lee et al., 22 and Limon et al., 23 the lifetime of parts and products usually follows an exponential distribution, gamma distribution, or Weibull distribution. Because the lifetime of a product is a longer‐the‐better type of quality characteristic, Montgomery 24 recommended the use of lifetime performance index (LPI)

{C_L}

to measure the lifetime performance of electronic products.…”

Section: Introductionmentioning

confidence: 99%

A repetitive group sampling plan based on the lifetime performance index under gamma distribution

Lee

Liu

2022

Quality & Reliability Eng

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As technology and living standards improve, people are becoming more concerned with the importance of quality. Quality, thus, becomes the key to company competitiveness, and process capability indices (PCIs) are effective means of measuring process performance. Most PCIs have been developed under the assumption that the quality characteristics are normally distributed; however, the lifetime of products generally possesses a non‐normal distribution. A lifetime performance index (LPI) CL has been proposed and used for measuring product lifetime performance. In this high‐quality era, the use of traditional testing methods incurs very high costs, so acceptance sampling plans have been widely used by industry to perform the inspection. This study considers the product lifetime with a gamma distribution and uses the uniformly minimum‐variance unbiased estimator (UMVUE) of the LPI to develop a repetitive group sampling plan (RGSP). For the practical purpose, this study presents a step‐by‐step procedure and tabulates the plan parameters for various combinations of acceptable and rejectable quality levels, producer's and consumer's risks, and shape parameter. Thus, practitioners can easily know the sample size and the corresponding critical values for decision making. This study also uses the results of the proposed plan to compare with the single sampling plan. Lastly, a practical example is used to illustrate how to apply this acceptance sampling plan.

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“…The stresses include voltage, UV, salt, and temperature. Limon et al 21 designed an ADT with multiple stresses considering the Gamma process. The study on a type of carbon film resistor was used to show the advantages of multi-stress ADT.…”

Section: Introductionmentioning

confidence: 99%

A load spectra design method for multi-stress accelerated testing

Nie

Liao

2021

Proceedings of the Institution of Mechanical Engineers, Part O:

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Accelerated testing (AT) is an effective testing method for evaluating the reliability of highly reliable products. In many applications, such products are often subject to multiple stresses in actual working environments. Then, how to design the load spectra for multi-stress AT becomes a critical issue. In this paper, a new load spectra design method is proposed to overcome this challenge. Considering the properties of multiple stresses, a novel multi-stress loading matrix (MSLM) is modified to fully describe the load spectra in actual working environments and to generate the corresponding load spectra for AT. For illustration purposes, an inverse Gaussian (IG) process incorporating life-stress relationships is adopted to model product degradation under multiple stresses. A case study on a type of hydraulic piston pump is provided to demonstrate the use of the proposed method in guiding the load spectra design for multi-stress AT.

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Designing an accelerated degradation test plan considering the gamma degradation process with multi-stress factors and interaction effects

Cited by 21 publications

References 20 publications

Optimizing two‐variable gamma accelerated degradation tests with a semi‐analytical approach

Optimizing two‐variable gamma accelerated degradation tests with a semi‐analytical approach

A repetitive group sampling plan based on the lifetime performance index under gamma distribution

A load spectra design method for multi-stress accelerated testing

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