1993
DOI: 10.1016/0304-3991(93)90196-5
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Detection limits in quantitative off-axis electron holography

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Cited by 112 publications
(34 citation statements)
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“…The phase sensitivity and spatial resolution of off-axis electron holography have been discussed by de Ruijter & Weiss (1993), who suggested that a practical phase sensitivity of 2π/100 radians can be achieved by using digital recording and image processing. In magnetic samples, this sensitivity corresponds to a detectable signal from a ~6 nm particle with a magnetization similar to that of cobalt (1.8 T).…”
Section: Discussionmentioning
confidence: 99%
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“…The phase sensitivity and spatial resolution of off-axis electron holography have been discussed by de Ruijter & Weiss (1993), who suggested that a practical phase sensitivity of 2π/100 radians can be achieved by using digital recording and image processing. In magnetic samples, this sensitivity corresponds to a detectable signal from a ~6 nm particle with a magnetization similar to that of cobalt (1.8 T).…”
Section: Discussionmentioning
confidence: 99%
“…Digital recording is also convenient for subsequent computer image processing, including reconstruction of holograms. A phase sensitivity of 2π/100 can be achieved by the use of digital recording and processing (de Ruijter & Weiss, 1993), in place of the use of an optical bench as a Mach-Zender interferometer (Tonomura, 1992). …”
Section: Requirements For Off-axis Electron Holographymentioning
confidence: 99%
“…It has thus to be distinguished from precision limitations in spatial and phase resolution in the instrumental acquisition procedure and the quantitative holographic phase reconstruction, which were discussed elsewhere. 4,5 The following discussion will be restricted to the extrinsic effects in holographic imaging experiments for indirect band-gap materials and focuses on general observations on the role of the sur- faces of the TEM samples and the observed potential map distortions in device structures.…”
Section: Discussionmentioning
confidence: 99%
“…4,5 Artifacts related to sample imperfectness are also described in literature: surface charging and surface "dead layers" 2,3 had to be considered for a proper quantification of the pn-junction potential. Both factors are reported to be sensitive to specimen preparation.…”
Section: Introductionmentioning
confidence: 99%
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