Detection of cadmium oxides on a CdTe substrate by X-AES

Debiemme‐Chouvy, Catherine; Marín, F. Iranzo; Roll, U.; Bujor, M.; Etchéberry, Arnaud

doi:10.1016/0039-6028(95)01186-2

Cited by 13 publications

(10 citation statements)

References 14 publications

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“…59 TeO 2 and CdO are building blocks for CdTeO 3 formation, but we are unable to resolve the oxidation component from Cd 3d 5/2 peak in case of sample D. This is due to the fact that the chemical shifts associated with (Cd-Te and Cd-O) are very close to each other. 60 On the other hand, CdTeO 3 is a native surface oxide to CdTe and its presence has been observed in x-ray diffractogram. Thus, the ex situ process expectedly promotes Te oxidation on the surface and the in situ process gives relatively oxide free surface.…”

Section: Xps Study For Surface Chemical Environment and Valence Bamentioning

confidence: 97%

Effect of in situ CdCl2 treatment on spray deposited CdTe∕CdS heterostructure

Krishna

Dutta

2004

Journal of Applied Physics

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CdTe thin films have been deposited without and with in situ CdCl2 treatment using spray pyrolysis technique. Scanning electron microscopy studies show enhanced grain growth in the presence of CdCl2. Glancing incidence angle x-ray diffraction is used to observe the microstructural changes of CdTe∕CdS heterostructure at different depths by changing the incident angle. Spraying of CdCl2 on CdS prior to CdTe deposition promotes S diffusion throughout CdTe film and also Te diffusion into CdS. There is an associated change in the microstress of the CdTe film at different layers. The films without CdCl2 treatment show compressive microstress varying from −98to−158MPa with increasing incident angle. CdCl2 spray during CdTe deposition leads to compressive microstress varying from −98MPa at the interface to −19MPa near the surface and CdCl2 spray prior to CdTe deposition leads to a mildly tensile stress (+20to+40MPa). Photoluminescence spectra for CdTe films with the in situ treatment show a reduction in the band gap due to S diffusion as well as the reduction in the defect band intensity. An in situ CdCl2 treatment results in less surface oxidation compared to ex situ process, as seen from x-ray photoelectron spectroscopy study. A shift of ∼200meV in the Fermi energy towards the valence band is also observed in valence band spectra after the in situ CdCl2 treatment.

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Section: Xps Study For Surface Chemical Environment and Valence Bamentioning

confidence: 97%

Effect of in situ CdCl2 treatment on spray deposited CdTe∕CdS heterostructure

Krishna

Dutta

2004

Journal of Applied Physics

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“…5 clearly suggest. 32 In order to fit the Te and Cd 3d lines, one needs to know the line width and approximate position for stoichiometric Cd 0.96 Zn 0.04 Te(211)B. We obtained such quantities from In the fits, the low binding-energy contribution is due to CdZnTe-Te, the high energy one to surface a-Te.…”

Section: Xpsmentioning

confidence: 99%

“…In general, Te oxides give rise to a well-resolved peak at higher energies in the Te 3d spectrum. [29][30][31][32] It has been reported that the oxidation of Te to form TeO 2 causes a chemical shift of~3.2 eV 31 ; that of CdTe to form CdTeO 3 causes ã 3.5 eV shift. The asymmetry of the lower-energy peak (shown in the two insets of Fig.…”

Section: Xpsmentioning

confidence: 99%

Fast Detection of Precipitates and Oxides on CdZnTe Surfaces by Spectroscopic Ellipsometry

Badano

Million

Canava

et al. 2007

Journal of Elec Materi

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We study the surface chemistry of Cd 0.96 Zn 0.04 Te(211)B by X-ray photoelectron spectroscopy and ellipsometry. We obtain first the dielectric functions of amorphous Te and Cd on Cd 0.96 Zn 0.04 Te(211)B by in situ ellipsometry after growing thin films of each material by molecular beam epitaxy. We then study their oxidation in air and show that Cd oxidizes primarily as a hydroxide whereas Te is present as TeO 2 . In neither case is the oxidation of the films complete, as a substantial amount of either metallic Te or Cd remains even after several days of oxidation. We subsequently exploit an electroless chemical etchant based on Ce 4+ to produce Te-rich Cd 0.96 Zn 0.04 Te(211)B surfaces which oxidize very little in air. Another etchant containing KCN reduces the amount of a-Te substantially. Finally, we construct a tentative optical model for the Cd 0.96 Zn 0.04 Te(211)B surface that yields the abundance of amorphous Te on the surface.

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“…The Cd 3d photoemission lines show only minor ( $ 0Á8 eV) chemical shifts in the series consisting of Cd metal, CdS and CdTe, whereas the Cd MNN Auger lines undergo substantially larger (>2 eV) chemical shifts and significant changes in line shape. 81,82 Several other aspects of AES are of particular concern to those working with PV materials. The high current densities (10 4 A Á cm À2 ) possible with field-emitter sources can cause changes in a material during analysis.…”

Section: Auger Electron Spectroscopy (Aes)mentioning

confidence: 99%

Physical characterization of thin‐film solar cells

Durose¹,

Asher²,

Jaegermann³

et al. 2004

Progress in Photovoltaics

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The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and timeresolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials systems.

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Detection of cadmium oxides on a CdTe substrate by X-AES

Cited by 13 publications

References 14 publications

Effect of in situ CdCl2 treatment on spray deposited CdTe∕CdS heterostructure

Effect of in situ CdCl2 treatment on spray deposited CdTe∕CdS heterostructure

Fast Detection of Precipitates and Oxides on CdZnTe Surfaces by Spectroscopic Ellipsometry

Physical characterization of thin‐film solar cells

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