Detection of defect-induced luminescence in epoxy-based insulation materials via phase-resolved photon counting method

Abstract

Electroluminescence (EL) has shown promise in detecting micro-defects in epoxy-based insulation materials. Understanding the various luminescence mechanisms caused by defects is crucial for improving the characterization and analysis of insulation defects. In light of this, this study proposes a photon counting-based approach to investigate the impact of defects on the entire evolutionary process of the luminescence mechanism. A phase-resolved photon counting (PRPC) method is proposed to examine the polarity and periodicity of photon counting results influenced by defects. Additionally, a simulation model based on the finite element method (FEM) is established to analyze how defects modify the distribution of electric field and space charges. Observations suggest that the PRPC-based approach holds promise for advancing the defect analysis of epoxy insulation used in gas-insulated equipment.