Detection of Disk-Like Particles in Electron Microscopy Images

Spurek, Przemysław; Tabor, Jacek; Zając, Elżbieta

doi:10.1007/978-3-319-00969-8_40

Cited by 8 publications

(6 citation statements)

References 8 publications

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“…5(b) the result of the spherical algorithm with circles fitted to the obtained clusters is presented. This family can be used for the recognition of circular-shape objects, see Spurek et al (2013).…”

Section: G Ri -Spherical Gaussians With a Fixed Radiusmentioning

confidence: 99%

“…In particular, contrary to GMM, new models can easily be added without the need for complicated optimization (Section 4). Consequently, this allows the use of CEC as an elliptic pattern recognition tool (Tabor and Misztal (2013); Spurek, Tabor, and Zajac (2013)). The motivation of CEC comes from the observation that in the case of coding it is often profitable to use various compression algorithms specialized in different data types.…”

Section: Introductionmentioning

confidence: 99%

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Introduction to Cross-Entropy Clustering The R Package CEC

Tabor¹,

Spurek²,

Kamieniecki³

et al. 2015

Preprint

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The R Package CEC Kamieniecki and Spurek (2014) performs clustering based on the cross-entropy clustering (CEC) method, which was recently developed with the use of information theory. The main advantage of CEC is that it combines the speed and simplicity of k-means with the ability to use various Gaussian mixture models and reduce unnecessary clusters. In this work we present a practical tutorial to CEC based on the R Package CEC. Functions are provided to encompass the whole process of clustering.

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Section: G Ri -Spherical Gaussians With a Fixed Radiusmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Introduction to Cross-Entropy Clustering The R Package CEC

Tabor¹,

Spurek²,

Kamieniecki³

et al. 2015

Preprint

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show abstract

“…For measuring the size of a large number of particles (more than a hundred) via SEM/TEM or AFM, researchers generally use various image processing algorithms that allow rapid recognition of particles [19][20][21][22][23][24].…”

Section: Introductionmentioning

confidence: 99%

A new approach of recognition of ellipsoidal micro- and nanoparticles on AFM images and determination of their sizes

Akhmadeev

Салахов

2016

Meas. Sci. Technol.

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In this work we develop an approach of automatic recognition of ellipsoidal particles on the atomic force microscopy (AFM) image and determination of their size, which is based on image segmentation and the surface approximation by ellipsoids. In addition to the comparative simplicity and rapidity of processing, this method allows us to determine the size of particles, the surface of which is not completely visible on the image. The proposed method showed good results on simulated images including noisy ones. Using this algorithm the size distributions of silica particles on experimental AFM images have been determined.

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“…2(b)). In our paper CEC (cross entropy clustering) [13,14,15,16] algorithm is used for binarization.…”

Section: Introductionmentioning

confidence: 99%

A Local Gaussian Filter and Adaptive Morphology as Tools for Completing Partially Discontinuous Curves

Spurek¹,

Chaikouskaya²,

Tabor³

et al. 2014

Computer Information Systems and Industrial Management

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This paper presents a method for extraction and analysis of curve-type structures which consist of disconnected components. Such structures are found in electron-microscopy (EM) images of metal nanograins, which are widely used in the field of nanosensor technology.The topography of metal nanograins in compound nanomaterials is crucial to nanosensor characteristics. The method of completing such templates consists of three steps. In the first step, a local Gaussian filter is used with different weights for each neighborhood. In the second step, an adaptive morphology operation is applied to detect the endpoints of curve segments and connect them. In the last step, pruning is employed to extract a curve which optimally fits the template.

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Detection of Disk-Like Particles in Electron Microscopy Images

Cited by 8 publications

References 8 publications

Introduction to Cross-Entropy Clustering The R Package CEC

Introduction to Cross-Entropy Clustering The R Package CEC

A new approach of recognition of ellipsoidal micro- and nanoparticles on AFM images and determination of their sizes

A Local Gaussian Filter and Adaptive Morphology as Tools for Completing Partially Discontinuous Curves

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