2001
DOI: 10.1081/mst-100103180
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Detection of Ductile to Brittle Transition in Microindentation and Microscratching of Single Crystal Silicon Using Acoustic Emission

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Cited by 19 publications
(8 citation statements)
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“…14) during cutting are already known as major sources of AE signal generations [29]. With the depth near or over d c value (brittle regime), not just AE energy levels, but more sophisticated analysis such as detailed spectral analysis should be performed to investigate various signal characteristics during the deformation and/or fracture processes [19][20]30].…”
Section: Ae Monitoring During Nano-scratchingmentioning
confidence: 99%
See 1 more Smart Citation
“…14) during cutting are already known as major sources of AE signal generations [29]. With the depth near or over d c value (brittle regime), not just AE energy levels, but more sophisticated analysis such as detailed spectral analysis should be performed to investigate various signal characteristics during the deformation and/or fracture processes [19][20]30].…”
Section: Ae Monitoring During Nano-scratchingmentioning
confidence: 99%
“…These low intensity, high frequency (100 kHz-1 MHz) elastic waves propagate in all directions through the structure to a detector on the surface of the workpiece. In previous research, AE has been shown to be sensitive to a variety of characteristics in precision manufacturing processes including nano-order applications [12][13][19][20]]. Fig.…”
Section: Introductionmentioning
confidence: 99%
“…In [32,33] the registration of acoustic emission was proposed as a means of determining a ductile brittle transition in scratching silicon [32], silicon carbide and quartz [33]. A method of the direct infrared optical registration of phase transitions in scratching is described in [34].…”
Section: Plastic Brittle Transition and Phase Transformationsmentioning
confidence: 99%
“…These lowintensity high-frequency (100 kHz to 1 MHz) elastic waves propagate in all directions through the structure to a detector on the surface of the workpiece. Previous research has shown that AE is sensitive to a variety of characteristics in precision manufacturing processes, including ultra-precision nano-order applications [19][20][21][22]. The generation of AE signals is subject to the characteristics of object materials used in the polishing process, and relevant information can be extracted from AE signals using various signal processing techniques, including time series and spectral analysis according to process features.…”
Section: Ae and Force Signals During Mafmentioning
confidence: 99%