2015
DOI: 10.1109/temc.2014.2363675
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Detection of Electromagnetic Radiations Sources at the Switching Time Scale Using an Inverse Problem-Based Resolution Method—Application to Power Electronic Circuits

Abstract: This paper presents a detailed study about the characterization of electromagnetic near-fields emitted from power electronic circuits. The approach proposed here provides a radiation model, which verifies the uniqueness of the solution using an inverse problem-based resolution method. For this purpose, the characterization method has been combined with an experimental mapping realized at the switching time scale. This mapping is based on a Fourier analysis applied on the measurements acquired from the device u… Show more

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Cited by 37 publications
(24 citation statements)
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“…However, an inherent delay is produced between target noise signal and generated antiphase noise signal [23] due to the bandwidth limitation and the propagation delay of the feedback system. The spectrum analysis of the switching waveform of the metal oxide semiconductor field effect transistor (MOSFET)-based buck converter shows a clear violation of noise limit [24]. Therefore, we need an advance predictive method for the computation of the antiphase noise signal [25].…”
Section: Active Noise Cancellationmentioning
confidence: 99%
“…However, an inherent delay is produced between target noise signal and generated antiphase noise signal [23] due to the bandwidth limitation and the propagation delay of the feedback system. The spectrum analysis of the switching waveform of the metal oxide semiconductor field effect transistor (MOSFET)-based buck converter shows a clear violation of noise limit [24]. Therefore, we need an advance predictive method for the computation of the antiphase noise signal [25].…”
Section: Active Noise Cancellationmentioning
confidence: 99%
“…Hence, the consideration of Electromagnetic Compatibility (EMC) modelling techniques has become a crucial solution to deal with the unwanted interferences and improve systems design. In electronics industry, devices are especially affected by noisy transient signals [1]. Therefore, to cope with the harmful Electromagnetic (EM) coupling, researchers have developed many characterization approaches for emissive systems.…”
Section: Introductionmentioning
confidence: 99%
“…To carry out an efficient EMC study, it is useful to know the EM field distribution in a near region around the circuit under test. Actually, the near field technique is considered as an appropriate approach to characterize radiating structures [1]- [9]. But, due to the expensive measurements cost, this task relies on the use of a robust numerical process.…”
Section: Introductionmentioning
confidence: 99%
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