“…Using the above equations to detect the disturbance, the defects could be identified. An in-house low critical temperature (T c ) SQUID-NDE system, constructed in the National Institute of Advanced Industrial Science and Technology (AIST) [18,19], was used to detect damage in notched C/C composites (CT specimens, W = 100 mm for 2D C/Cs, W = 50 mm for 3D C/Cs). This system was composed of a low-T c SQUID sensor, a planar gradiometer (pick-up coils), SQUID electronics, a helium dewar, an x-y scanning stage, and a lock-in amplifier, as shown in Fig.…”