Detection of weak X-ray waves scattered by the crystal subsurface inclusions

Abstract

C448 reversed by changing the phase of hr and hi as shown in the figure below. This clearly shows that such a change of contrast using resonant scattering should be quite useful to analyze characteristics of defects in a crystal.

Optimal thickness of non-diffracting subsurface mirrors of X-ray optical memory

“…According [3], the most part of x-ray wave field energy is back warded from the X-ROM's crystalline substrate caused by the x-ray specular (mirror) wave suppression phenomenon. Consequently, if the GIXB takes place in conditions of the specular vacuum wave suppression mode, then the reflected wave K r (contrary to other existing x-ray diffraction methods) practically carries the information only about non-diffracting subsurface mirrors [4]. We consider in presented theoretical paper the effective depths of penetration of the non-homogeneous x-ray wave fields in crystalline substrate and amorphous segments of the X-ROM respectively, when the angle of incidence i θ of the x-ray micro beam K i is exactly satisfying the Bragg's Law, i.e.…”