“…It was discovered by measuring IV characteristics in n-Ge (Ašmontas, Požela & Repšas, 1975) and n-Si (Ašmontas, 1975) semiconductors at temperatures of 300 K and 77 K. Although these bigradient diodes had high electrical resistance, so in planar thermoelectric diodes the more necked side was doped that resulted in lower electrical resistance and faster operation speed (Ašmontas et al, 2000). In this case, the detected voltage consists of both the bigradient and hot carrier thermoelectric forces (Ašmontas, Gradauskas, Kožič, Shtrikmann & Sužiedėlis, 2005;Ašmontas et al, 2009). Non-uniform heating in the planar thermoelectric diode was achieved, namely, using an asymmetrically necked thin semiconductor film containing the n-n + -GaAs junction and the n-Si doped monocrystal structure (Ašmontas & Sužiedėlis, 1994;Ašmontas et al, 2005).…”