Détermination du Critère D'arrêt Pour le Maximètre Monochromatique, Système de Contrôle Optique de Couches Minces Multidiélectriques

Candille, Marcel

doi:10.1080/713819947

Cited by 1 publication

(2 citation statements)

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“…Indeed, the realization of a multilayer is necessarily tainted with fabrication errors which are related to the deposition technology, to the thickness control technique (optical, quartz, stopwatch ...) and the multilayer design itself [58]. The basic principle for optical control of thin solid film deposition [59] is that for a thin layer illuminated at a given controlled wavelength λ c , extremum in the transmission is achieved whenever the optical thickness ne is a multiple of a quarter of this wavelength with n(λ c )e = pλ c /4, p being the number of extremum occurrences. This result remains true if the thickness increases on a multilayer already manufactured, provided that it is of real admittance.…”

Section: Introductionmentioning

confidence: 99%

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Sensitivity of resonance properties of all-dielectric multilayers driven by statistical fluctuations

Lereu¹,

Lemarchand²,

Zerrad³

et al. 2019

Opt. Express

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In photonics and emerging fields of quantum and topological materials, increasing demands are placed upon the state and control of electromagnetic fields. Dielectric multilayer materials may be designed and optimized to possess extremely sharp spectral and angular photonic resonances allowing for the creation of fields orders of magnitude larger than the exciting field. With enhancements of 10 4 and higher, the extreme nature of these resonances places high constraints on the statistical properties of the physical and optical characteristics of the materials. To what extent the spectral and angular shifts occur as a result of fluctuations in the refractive indices and morphologies of the involved low-loss subdomains have not been considered previously. Here, we present how parameter variations such as those caused by fluctuations in deposition rate, yielding bias, random and compensated errors, may affect the resonance properties of low-loss all-dielectric stacks.

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Section: Introductionmentioning

confidence: 99%

“…Provided that the deposition rate v = de/dt is quasi-constant, the resulting extrema are then identical to those of T(e, λ c ). To spot these extrema, we carry out a real time derivation of the control signal and we stop the deposit as soon as the derivative goes through a zero [59].…”

Section: Introductionmentioning

confidence: 99%