2021
DOI: 10.3390/cryst11111389
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Determination of Absolute Structure of Chiral Crystals Using Three-Wave X-ray Diffraction

Abstract: We propose a new method to determine the absolute structure of chiral crystals, which is based on the chiral asymmetry of multiple scattering diffraction. It manifests as a difference in the azimuthal dependence of the forbidden Bragg reflection intensity measured with left and right circularly polarized X-ray beams. Contrary to the existing ones, the suggested method does not use X-ray anomalous dispersion. The difference between the Renninger scans with circularly polarized X-rays has been experimentally dem… Show more

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Cited by 4 publications
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“…As the profile asymmetries are related to the structure factor phases of two or more simultaneously excited hkl reflections, MD experiments have been used as a refinement tool capable of uncovering structural details beyond the resolution limit of other techniques. A list of applications mainly related to phase measurements includes improvement of diffraction anomalous fine structure techniques (Lee et al, 2006;Liu et al, 2016), studies of orbital and charge ordering in magnetic materials (Shen et al, 2006;Weng et al, 2012;Liu et al, 2017), probing minor internal strain induced by ion doping in optical crystals (Morelha ˜o et al, 2011;Amirkhanyan et al, 2014), identification of chirality in crystals with no resonant atoms (Hu ¨mmer & Weckert, 1995;Shen et al, 2000;Morelha ˜o et al, 2015;Kozlovskaya et al, 2021), validation of ionic model structures for amino acid crystals (Morelha ˜o et al, 2017) and inspection of phonon scattering mechanisms in thermoelectric materials (Vale ´rio et al, 2020). This list of successful applications has been possible after decades of knowledge in theoretical approaches and experimental procedures to process MD line-profile asymmetries into structural information (Hart & Lang, 1961;Colella, 1974;Post, 1977;Chapman et al, 1981;Juretschke, 1982;Chang, 1997;Weckert & Hu ¨mmer, 1997;Chang et al, 1999;Wang et al, 2001;Mo et al, 2002;Morelha ˜o & Kycia, 2002;Morelha ˜o, 2003b;Soares et al, 2003;Shen, 2003;Thorkildsen et al, 2003).…”
Section: Introductionmentioning
confidence: 99%
“…As the profile asymmetries are related to the structure factor phases of two or more simultaneously excited hkl reflections, MD experiments have been used as a refinement tool capable of uncovering structural details beyond the resolution limit of other techniques. A list of applications mainly related to phase measurements includes improvement of diffraction anomalous fine structure techniques (Lee et al, 2006;Liu et al, 2016), studies of orbital and charge ordering in magnetic materials (Shen et al, 2006;Weng et al, 2012;Liu et al, 2017), probing minor internal strain induced by ion doping in optical crystals (Morelha ˜o et al, 2011;Amirkhanyan et al, 2014), identification of chirality in crystals with no resonant atoms (Hu ¨mmer & Weckert, 1995;Shen et al, 2000;Morelha ˜o et al, 2015;Kozlovskaya et al, 2021), validation of ionic model structures for amino acid crystals (Morelha ˜o et al, 2017) and inspection of phonon scattering mechanisms in thermoelectric materials (Vale ´rio et al, 2020). This list of successful applications has been possible after decades of knowledge in theoretical approaches and experimental procedures to process MD line-profile asymmetries into structural information (Hart & Lang, 1961;Colella, 1974;Post, 1977;Chapman et al, 1981;Juretschke, 1982;Chang, 1997;Weckert & Hu ¨mmer, 1997;Chang et al, 1999;Wang et al, 2001;Mo et al, 2002;Morelha ˜o & Kycia, 2002;Morelha ˜o, 2003b;Soares et al, 2003;Shen, 2003;Thorkildsen et al, 2003).…”
Section: Introductionmentioning
confidence: 99%