2015
DOI: 10.1016/j.ijleo.2015.07.039
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Determination of beam incidence conditions based on the analysis of laser interference patterns

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Cited by 6 publications
(5 citation statements)
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“…To further verify the feasibility of the lithography method, the contrasts of the two-and four-beam TE 0 guided mode interference writing periodic structures were calculated using the following equation [27]:…”
Section: Simulation Resultsmentioning
confidence: 99%
“…To further verify the feasibility of the lithography method, the contrasts of the two-and four-beam TE 0 guided mode interference writing periodic structures were calculated using the following equation [27]:…”
Section: Simulation Resultsmentioning
confidence: 99%
“…Different patterns can be achieved by LIL via controlling the process parameters, such as incident angles of beams and wavelength, polarisation directions, laser fluencies and exposure durations. The period of the structures can be determined by the incident angles [73]. Nano gratings can be achieved by two-beam interference lithography.…”
Section: Laser Interference Lithographymentioning
confidence: 99%
“…DLIP has been demonstrated as a promising surface engineering tool for producing long-range well-defined high-resolution surface patterns with high throughput 9 . 2–5 beam DLIP is commonly used to grow patterned materials, such as in molecular-beam epitaxy reactors for nanolithography 10 12 . DLIP has mostly been demonstrated in vacuum or in low-pressure reactive gases environment.…”
Section: Introductionmentioning
confidence: 99%