2018
DOI: 10.3390/electronics8010021
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Determination of Complex Conductivity of Thin Strips with a Transmission Method

Abstract: Induced modes due to discontinuities inside the waveguide are dependent on the shape and material properties of the discontinuity. Reflection and transmission coefficients provide useful information about material properties of discontinuities inside the waveguide. A novel non-resonant procedure to measure the complex conductivity of narrow strips is proposed in this paper. The sample is placed inside a rectangular waveguide which is excited by its fundamental mode. Reflection and transmission coefficients are… Show more

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Cited by 6 publications
(6 citation statements)
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References 32 publications
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“…A new method and prototype system for measuring the relative permittivity and loss tangent of dielectric materials has been developed by using a perturbation in the input impedance of a transmitting rectangular microstrip patch antenna when the MUT such as dielectric slab, disc or sphere is placed nearby the antenna with some spacing [28,29]. A new method to measure the complex conductivity of the graphene and thin film materials in a thin strip shape was proposed based on the reflection and transmission on the transverse electric(TE) modes in a rectangular waveguide [30]. A small portion of the MUT was placed inside the waveguide for permittivity characterization.…”
Section: Introductionmentioning
confidence: 99%
“…A new method and prototype system for measuring the relative permittivity and loss tangent of dielectric materials has been developed by using a perturbation in the input impedance of a transmitting rectangular microstrip patch antenna when the MUT such as dielectric slab, disc or sphere is placed nearby the antenna with some spacing [28,29]. A new method to measure the complex conductivity of the graphene and thin film materials in a thin strip shape was proposed based on the reflection and transmission on the transverse electric(TE) modes in a rectangular waveguide [30]. A small portion of the MUT was placed inside the waveguide for permittivity characterization.…”
Section: Introductionmentioning
confidence: 99%
“…Here, we consider two test functions, namely the uniform and cosh distributions. Performing the integration in (2) and 3, the coefficients of I n U and I n C for uniform and cosh distributions are [6]:…”
Section: Measurement Methodsmentioning
confidence: 99%
“…Before attempting to compute the series numerically, tests from calculus [7] are used to ensure that the series are not diverging. In fact, it is possible to prove that the series in (6) are absolutely convergent. The sequence of elements in all series (6) approaches zero for large values of n which is essential for the convergence of any series.…”
Section: Series Convergencementioning
confidence: 99%
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“…In addition to the research in transistors and memory devices, this issue has collected important research on solar cells based on ZnO/Si heterojunctions [13], Bi-doped and Bi-Er co-doped optical fibers [14], high-performance graphene electrolyte double-layer capacitors [15], quantum-dot and sample-grating semiconductor optical amplifiers [16], a transmission method to determine the complex conductivity of thin strips [17], and a high-efficiency CMOS power amplifier with a dual-switching transistor [18].…”
Section: The Current Research Trendsmentioning
confidence: 99%