A B S T R A C TTo study the mechanisms affecting the crack propagation rate for fatigue cracks exposed to an overload, an in situ scanning electron microscope technique was used, together with potential drop measurements. High-resolution images were analysed with an image analysis program to measure the displacements along the crack, and the potential drop technique was employed to measure the electrical contact between the fatigue crack surfaces. The crack closure level could, by image analysis, be determined as close as 1 μm from the crack tip. The indications from the image analysis pointed towards a somewhat lower closure load as compared to the potential drop technique. The effect of an overload on the crack propagation rate was found to depend on the magnitude of the overload in combination with the steady-state conditions. Both overload induced crack retardation and crack acceleration was noticed to occur. a = crack length (m) f = geometry function (-) F = applied tensile load (N) F cl,cc = crack closure load level according to compliance measurements (N) F cl,PD = crack closure load level according to potential drop (N) F cl.before,cc = crack closure level before the overload cycle according to cross correlation (N) F cl,after,cc = crack closure level after the overload cycle according to cross correlation (N) F cl.before,PD = crack closure level before the overload cycle according to potential drop (N) F cl.after,PD = crack closure level after the overload cycle according to potential drop (N) F max = maximum tensile load (N) F ol = maximum load for the overload cycle (N) I = direct current (A) K cl = stress intensity factor level at crack closure (Pam 1 2 ) K max = stress intensity factor level at maximum tensile load (Pam 1 2 ) K min = stress intensity factor level at minimum tensile load (Pam 1 2 ) PD-signal = potential drop over the crack tip (V) r m = distance behind the crack tip where the displacements are measured (m) R = applied steady-state load ratio U = portion of the load cycle that the crack is open