Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 1996
DOI: 10.1109/pvsc.1996.564233
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Determination of facet orientations on alkaline etched multicrystalline wafers

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“…Determination of facet orientations.-Scatter measurements are used in combination with Laue photography 6 to determine the orientations of the exposed etch facets in terms of their Miller indexes. There are parallels between the Laue and scatter methods.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…Determination of facet orientations.-Scatter measurements are used in combination with Laue photography 6 to determine the orientations of the exposed etch facets in terms of their Miller indexes. There are parallels between the Laue and scatter methods.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%