“…Based on the geometric reliability algorithm proposed by the author,
4,5 the critical PDPs and the limit state curve intersect at a specific point, which is defined as the design point and is denoted by “× .” The pseudo‐design point (represented by “+”)
17 is an intersection of the line between the mean point and the design point and the single standard deviation configuration. The computed regression pairs are represented by “*,” and their mean value is represented by “○.” For comparison, the probability density iso‐contour configuration with
is illustrated in Figure 7, which is close to the single standard deviation ellipse, but the two do not completely coincide due to the non‐normal characteristics of the joint distribution of the two random variables.…”