2023
DOI: 10.1680/jgeen.20.00204
|View full text |Cite
|
Sign up to set email alerts
|

Determination of geometric reliability index of piles at site-specific scale: case studies

Abstract: An application of geometric reliability techniques on various pile types based on 67 load–displacement curves obtained from pertinent literature is presented in this paper. These static loading tests were performed at local scale (even building-specific sites) under essentially identical geotechnical conditions. A power-law function with two parameters was used to fit the measured load–settlement curves. For each site, the means and coefficients of variation for the power-law parameters were obtained. Since th… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
7
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(7 citation statements)
references
References 16 publications
0
7
0
Order By: Relevance
“…In the geometric reliability algorithm proposed previously, 4,5 it is necessary to find the design point on the critical probability density contour and the pseudo‐design point on the single standard deviation configuration, whereby the reliability index β is defined by a distance ratio, as follows: βbadbreak=LnormalD/0ptLnormalDLnormalC0.0ptLnormalC$$\begin{equation}\beta = {{{L}_{\mathrm{D}}} \mathord{\left/ {\vphantom {{{L}_{\mathrm{D}}} {{L}_{\mathrm{C}}}}} \right. \kern-\nulldelimiterspace} {{L}_{\mathrm{C}}}}\end{equation}$$where L D is the distance from the design point on the critical probability density contour to the mean‐value point, and L C is the distance from the pseudo‐design point on the single standard deviation hyper‐ellipsoid to the mean‐value point.…”
Section: Discussionmentioning
confidence: 99%
See 4 more Smart Citations
“…In the geometric reliability algorithm proposed previously, 4,5 it is necessary to find the design point on the critical probability density contour and the pseudo‐design point on the single standard deviation configuration, whereby the reliability index β is defined by a distance ratio, as follows: βbadbreak=LnormalD/0ptLnormalDLnormalC0.0ptLnormalC$$\begin{equation}\beta = {{{L}_{\mathrm{D}}} \mathord{\left/ {\vphantom {{{L}_{\mathrm{D}}} {{L}_{\mathrm{C}}}}} \right. \kern-\nulldelimiterspace} {{L}_{\mathrm{C}}}}\end{equation}$$where L D is the distance from the design point on the critical probability density contour to the mean‐value point, and L C is the distance from the pseudo‐design point on the single standard deviation hyper‐ellipsoid to the mean‐value point.…”
Section: Discussionmentioning
confidence: 99%
“…2. Take the intermediate value 𝛽 mid between 𝛽 min and 𝛽 max , substituting it into Equation ( 4) and combining Equations (5) to (10) in order to derive the PDP coordinates associated with the reliability index of 𝛽 mid . These coordinates are substituted into the limit state equation to determine whether there is a point outside the critical surface (𝑔 ≤ 0).…”
Section: Identification Of the Critical Pdp And Determination Of The ...mentioning
confidence: 99%
See 3 more Smart Citations