Determination of impurities in copper metal using total reflection X‐ray fluorescence spectrometry after matrix separation: Method validation and uncertainty assessment

Abstract

TXRF spectrometry has been utilized for the determination of impurities in copper metal. Multielement standard solution has been used for the calibration of TXRF spectrometer. To avoid the matrix effects, Cu was separated by electrochemical separation method under optimized condition followed by determination of impurities using TXRF. K, Ca, Fe, Ni, and Zn are the impurities found to be present in copper metal. Bottom up approach was employed to get the measure of the combined uncertainty in the results. The uncertainty associated with the recovery of electrochemical separation process is the highest. The TXRF results were validated by analyzing the same sample using ICP‐OES. Student's t‐test was performed to establish the statistical indistinguishability of the results obtained from TXRF and ICP‐OES.