2006
DOI: 10.1063/1.2345587
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Determination of junction temperature in AlGaInP∕GaAs light emitting diodes by self-excited photoluminescence signal

Abstract: The photoluminescence (PL) of the GaAs substrate excited by the electroluminescence of the active layer is adopted to determine the junction temperature in AlGaInP∕GaAs light emitting diodes. Based on the Varshni equation for GaAs, the temperature measured by this approach is consistent with that obtained by the emission peak energy shift approach. As the PL signal is generated within the substrate, no calibration dependent on the device structure is necessary to determine the junction temperature of the devic… Show more

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Cited by 41 publications
(17 citation statements)
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“…The band A (B) shifts toward higher (lower) energies when J is increased; the peak photon energies of band A are 1.406, 1.4065, and 1.414 eV, whereas those of band B are 1.365, 1.360, and 1.351 eV, at J = 22, 55, and 110 A/cm 2 , respectively. Using the observed blue and red shifts at J = 110 A/cm 2 , electron density and the temperature in the p-GaAs active layer are estimated to be ∼6 × 10 17 cm −3 and ∼319 K, respectively (44). Note that this electron density is around ∼1/5 of the threshold density for CP lasing that has been estimated by the optical pumping experiments using the vertical-cavity surface-emitting laser incorporating a bulk, undoped GaAs active layer (d = 485 nm) (24).…”
Section: Significancementioning
confidence: 99%
“…The band A (B) shifts toward higher (lower) energies when J is increased; the peak photon energies of band A are 1.406, 1.4065, and 1.414 eV, whereas those of band B are 1.365, 1.360, and 1.351 eV, at J = 22, 55, and 110 A/cm 2 , respectively. Using the observed blue and red shifts at J = 110 A/cm 2 , electron density and the temperature in the p-GaAs active layer are estimated to be ∼6 × 10 17 cm −3 and ∼319 K, respectively (44). Note that this electron density is around ∼1/5 of the threshold density for CP lasing that has been estimated by the optical pumping experiments using the vertical-cavity surface-emitting laser incorporating a bulk, undoped GaAs active layer (d = 485 nm) (24).…”
Section: Significancementioning
confidence: 99%
“…The wavelength shift is caused by the residual increase in temperature associated with the increase in dissipated power with increasing bias current [13,14].…”
Section: Spectral Distributionmentioning
confidence: 99%
“…[19][20][21][22][23][24] The temperature coefficient of the operating voltage should be obtained first. Figure 2 shows the currentvoltage (I-V) curves of the device under various temperatures.…”
Section: Junction Temperature Measurementmentioning
confidence: 99%