2003
DOI: 10.1346/ccmn.2003.0510607
|View full text |Cite
|
Sign up to set email alerts
|

Determination of Layer-Charge Characteristics of Smectites

Abstract: A new method for calculation of layer charge and charge distribution of smectites is proposed. The method is based on comparisons between X-ray diffraction (XRD) patterns of K-saturated, ethylene glycol-solvated, oriented samples and calculated XRD patterns for three-component, mixed-layer systems. For the calculated patterns it is assumed that the measured patterns can be modeled as random interstratifications of fully expanding 17.1 Å layers, partially expanding 13.5 Å layers and non-expanding 9.98 Å layers.… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
57
0
6

Year Published

2006
2006
2024
2024

Publication Types

Select...
4
2
1

Relationship

1
6

Authors

Journals

citations
Cited by 70 publications
(64 citation statements)
references
References 32 publications
1
57
0
6
Order By: Relevance
“…Recently, Christidis and Eberl (2003) presented a novel method for determination of layer charge and charge distribution of smectites. The method is based on the comparison of XRD traces of K-saturated, ethylene-glycol solvated smectites with simulated XRD-traces calculated for threecomponent interlayering (fully expandable 17.1 Â layers, partially expandable, 13.5 Â layers and non-expandable 9.98 Â layers).…”
Section: The Methods Of Christidis and Eberl (2003)mentioning
confidence: 99%
See 3 more Smart Citations
“…Recently, Christidis and Eberl (2003) presented a novel method for determination of layer charge and charge distribution of smectites. The method is based on the comparison of XRD traces of K-saturated, ethylene-glycol solvated smectites with simulated XRD-traces calculated for threecomponent interlayering (fully expandable 17.1 Â layers, partially expandable, 13.5 Â layers and non-expandable 9.98 Â layers).…”
Section: The Methods Of Christidis and Eberl (2003)mentioning
confidence: 99%
“…In the case of smectites characterization of layer charge is of economic and geologic importance, because layer charge strongly affects key smectite properties such as swelling (McEwan and Wilson 1980), cation exchange capacity, and ion exchange selectivity (Maes and Cremers 1977). Smectites often are compositionally and structurally heterogeneous (Stul and Mortier 1974, Lagaly and Weiss 1975, Talibudeen and Goulding 1983, Nadeau et al 1985, Decarreau et al 1987, Iwasaki and Watanabe 1988, Lagaly 1994, Christidis and Eberl 2003. This heterogeneity contributes significantly to layer charge heterogeneity, both in terms of charge location (tetrahedral or beidellitic versus octahedral or montmorillonitic charge) and charge magnitude (i.e., individual smectite 2:1 layers may differ in charge, with the total layer charge for a sample being an average of these different charges).…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…Recently Christidis & Eberl (2003) [3] proposed a new method which calculates the layer charge and charge distribution of smectites with X-ray diffraction (XRD). The method is based on the saturation of the < 2 μm fraction with a cation of low hydration energy, mainly K, ethylene glycol solvation, subsequent X-ray diffraction and then determination of the layer charge and charge distribution of smectites by means of the LayerCharge program [3]. The method has been refined further to calculate the influence of tetrahedral charge on determination of layer charge.…”
mentioning
confidence: 99%