2013
DOI: 10.1016/j.apsusc.2013.05.122
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Determination of non-uniform graphene thickness on SiC (0001) by X-ray diffraction

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Cited by 45 publications
(36 citation statements)
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“…The chemical composition of the 4–6 carbophene samples were further studied by XPS analysis44454647. Figure 7(a) is the fully XPS spectrum of the 2D crystal sample coated on copper foil, which shows peaks corresponding to elements C, Cu, Al, and O.…”
Section: Resultsmentioning
confidence: 99%
“…The chemical composition of the 4–6 carbophene samples were further studied by XPS analysis44454647. Figure 7(a) is the fully XPS spectrum of the 2D crystal sample coated on copper foil, which shows peaks corresponding to elements C, Cu, Al, and O.…”
Section: Resultsmentioning
confidence: 99%
“…Because the graphene ring is obviously higher than the SiC substrate surface, bonds cannot form between the graphene ring edge and the SiC substrate. Previous results revealed that the graphene on the 0.3‐atm 1675 °C sample originates from C diffusion. The average terrace width on this sample is approximately 1.25 µm.…”
Section: Resultsmentioning
confidence: 54%
“…The structure and orientation of graphene and SiC on the samples were measured by reflection high‐energy electron diffraction (RHEED). The results reveal that the graphene unit cell is rotated by 30° with respect to the SiC unit cell (for details, please see our previous study). The edge direction of graphene rings was determined using STM measurements.…”
Section: Resultsmentioning
confidence: 99%
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“…The signal measured by ellipsometry depends on the thickness and the optical constants of the layer and thus, the thickness cannot be directly determined. X-ray diffraction has been also used to determine the thickness distribution of graphene layer [3]; this method needs high energy X-ray facility, however. It is interesting that Auger electron spectroscopy (AES), the classical surface sensitive analytical tool, has been rarely used in graphene research.…”
Section: Introductionmentioning
confidence: 99%