Abstract:In this work the tangent approach is valid on example of overlapping voltammetric peaks of Cd (II) and Tl (I) at their different concentration in a mixture. Height of the frame plotted by inflectional tangents to the inflection points on peak branches is used as a peak maximum for calibration curve plotting. It is founded that systematic errors are not significant for the measurement of Tl (I) peak. In case of the Cd (II) peak the significant systematic error arising from tailing of the ascending part of Tl (I… Show more
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