Determination of Shot Peened Surface States Using the Magnetic Barkhausen Noise Method

Hauk, Viktor; Höller, P.; Oudelhoven, Rene W. M.; Theiner, W.A.

doi:10.1007/978-3-642-84003-6_56

Cited by 6 publications

(6 citation statements)

References 2 publications

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“…the orientation distribution function is restricted to a number of localized maxima in Euler space) was proposed by Willemse et al (1982) and Willemse & Naughton (1985). The method was adapted to rolled specimens by Hauk & Vaessen (1985) (see also Hauk, 1986;Hauk & Oudelhoven, 1988; and to fibre-textured specimens by Baron & Hauk (1988). The concept of this method will be revisited next.…”

Section: Special Methods For Textured Macroscopically Elastically Anismentioning

confidence: 99%

“…Two approaches to the stress determination by diffraction on the basis of equation 86are indicated. Hauk & Vaessen (1985) (see also Hauk, 1986;Hauk & Oudelhoven, 1988) used analytical simplifications of equation 86assuming: (i) a principal stress state (i.e. all off-diagonal elements of the stress tensor expressed in the specimen reference frame are zero) and (ii) cubic crystal symmetry.…”

Section: Special Methods For Textured Macroscopically Elastically Anismentioning

confidence: 99%

“…When the texture is very sharp and strong, it may be described by single-crystal-like ideal orientations. The corresponding diffraction stress analysis method is called the crystallite group method (Willemse & Naughton, 1985;Willemse et al, 1982;Hauk & Vaessen, 1985;Hauk, 1986;Hauk & Oudelhoven, 1988;Baron & Hauk, 1988). In this limit, singlecrystal elastic compliances can be used and grain interaction can be ignored, i.e.…”

Section: Basismentioning

confidence: 99%

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Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction. The various analysis methods and measurement strategies, in dependence on specimen and measurement conditions, are summarized and evaluated in this paper. First, different X-ray diffraction geometries (conventional or grazing incidence) are described. Then, the case of macroscopically elastically isotropic, untextured specimens is considered: from the simplest case of a uniaxial state of stress to the most complicated case of a triaxial state of stress. The treatment is organized according to the number of unknowns to be determined (i.e. the state of stress, principal axes known or unknown), the use of one or several values of the rotation angle ' and the tilt angle of the sample, and one or multiple hkl reflections. Next, the focus is on macroscopically elastically anisotropic (e.g. textured) specimens. In this case, the use of diffraction (X-ray) elastic constants is not possible. Instead, diffraction (X-ray) stress factors have to be used. On the basis of examples, it is demonstrated that successful diffraction stress analysis is only possible if an appropriate grain-interaction model is applied.

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Section: Special Methods For Textured Macroscopically Elastically Anismentioning

confidence: 99%

Section: Special Methods For Textured Macroscopically Elastically Anismentioning

confidence: 99%

Section: Basismentioning

confidence: 99%

See 1 more Smart Citation

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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“…The method was adapted to rolled specimens by Hauk and Vaessen [29] (see also Refs. [30,31]). The crystallite group approach can, with certain restrictions, also be applied to fibre-textured specimens ( [32]; for discussion of (also) limitations, see Ref.…”

Section: Peak Position Analysismentioning

confidence: 97%

X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer

et al. 2006

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“…The texture may then be described by single-crystal-like ideal orientations. The corresponding diffraction stress analysis method is called the crystallite group method (CGM; Willemse & Naughton, 1985;Willemse et al, 1982;Hauk & Vaessen, 1985;Hauk, 1986;Hauk & Oudelhoven, 1988;Baron & Hauk, 1988). In this limit, single-crystal elastic compliances can be used instead of the diffraction elastic constants/diffraction stress factors [for details, see Welzel et al (2005); for, in particular, limitations of the CGM in the case of fibre texture, see ].…”

Section: (X-ray) Diffraction Stress Analysismentioning

confidence: 99%

Non-ambient X-ray diffraction residual stress analysis of thin films: tracing nanosize-related effects on thermoelastic constants and identifying sources of residual stresses

et al. 2008

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The stress evolutions at non-ambient temperatures in Ni and Pd layers (the thickness of each metal layer was 50 nm) were investigated employing in-situ X-ray diffraction measurements in a temperature range between 173 and 523 K. Stress determinations were performed by analysing the X-ray diffraction data according to the sin 2 method on the basis of the crystallite group variant. The stress evolution in the Ni layer was correlated with the change of its coherently diffracting domain size and its microstrain with temperature. The advantage of measurements at temperatures below ambient to distinguish the thermal stresses from the effects of stress relaxation and emerging secondary stresses, arising from thermally activated processes (such as grain growth), is highlighted in this work for the first time. The possibility of using the in-situ X-ray diffraction stress measurement to obtain coefficients of thermal expansion and thermoelastic slopes of thin films (with nanosized grains) is discussed in detail.

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Determination of Shot Peened Surface States Using the Magnetic Barkhausen Noise Method

Cited by 6 publications

References 2 publications

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer

Non-ambient X-ray diffraction residual stress analysis of thin films: tracing nanosize-related effects on thermoelastic constants and identifying sources of residual stresses

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