2012
DOI: 10.1016/j.ultramic.2012.03.014
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Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis

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Cited by 78 publications
(66 citation statements)
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“…This is probably due to surface strain relaxation: bending of atomic columns near the surface at the interfaces causes de-channelling of the electron probe and thereby a drop in the HAADF intensity (Grillo, 2009). The effect was observed with all the studied nanowires, and has earlier been observed with quantum well and quantum dot structures (Grillo, 2009;Grillo and Rossi, 2011;Grieb et al, 2012). For nanowire 2 the dip is more pronounced at the upper interface, between the ZB insert and WZ GaAs, although a clear drop is observed at the lower interface as well, where there is no change in the phase.…”
Section: Intensity Profiles Along the Nanowiressupporting
confidence: 76%
“…This is probably due to surface strain relaxation: bending of atomic columns near the surface at the interfaces causes de-channelling of the electron probe and thereby a drop in the HAADF intensity (Grillo, 2009). The effect was observed with all the studied nanowires, and has earlier been observed with quantum well and quantum dot structures (Grillo, 2009;Grillo and Rossi, 2011;Grieb et al, 2012). For nanowire 2 the dip is more pronounced at the upper interface, between the ZB insert and WZ GaAs, although a clear drop is observed at the lower interface as well, where there is no change in the phase.…”
Section: Intensity Profiles Along the Nanowiressupporting
confidence: 76%
“…Here, both the theory will significantly be extended and realistic image simulations to accurately describe experimental images will be used [23][24][25][26] allowing us to demonstrate our method to technologically important materials.…”
mentioning
confidence: 99%
“…via a detector scan [10], it is possible to compare simulations and experiment on the same intensity scale. Taking into account the sensitivity of the used detector quantitative results could be derived for various material systems [11][12][13].…”
Section: Introductionmentioning
confidence: 99%