Determination of the Complex Permittivity Values of Planar Dielectric Substrates by Means of a Multifrequency Pso-Based Technique

Abstract

Abstract-In this paper, an innovative technique for the determination of the dielectric properties of planar substrates is presented. Starting from a set of impedance measurements performed on a section of a microstrip transmission line built on the planar dielectric substrate under test, the proposed technique formulates the reconstruction problem in terms of an optimization one successively solved by means of an effective stochastic algorithm. Such a method allows one the reconstruction of the permittivity values at multiple frequencies by simply using a vector network analyzer and a standard calibration procedure for the impedance measurement. The results of some representative experimental tests are shown for a preliminary assessment of the effectiveness of the proposed approach.

Broadband Measurement of Complex Permittivity of Composite at Microwave Frequencies Using Scalar Scattering Parameters

“…Non-resonant techniques require full electromagnetic modelling of the measurement geometries for precise determination of permittivity at microwave frequencies. In references [17,18], scalar measurement technique is reported which is employed only for planar four-port microwave device.…”

A Time-Domain Approach to the Synthesis of Uwb Antenna Systems

“…Because of the continuous variables to be determined, the optimization is carried out by means of a PSO-based algorithm that widely proved its efficiency in solving such a kind of problems [21,[32][33][34]. Accordingly, the synthesized solution a opt turns out to be the trial set of parameters that minimizes a suitable cost function ξ a opt = arg min…”