Determination of the electron inelastic mean free path in some binary alloys for application in quantitative surface analysis

Silicon carbide (SiC) is a wideband semiconductor that is very promising for many applications in optoelectronics and microelectronics. Since information on the electron transport processes in SiC is scarce, its systematic study is highly desirable. The aim of this work is to determine experimentally by elastic peak electron spectroscopy (EPES), for the first time, the inelastic mean free paths (IMFPs) in bulk SiC with different structural properties (polycrystalline and monocrystalline materials) and surface concentrations of its constituents. The relative EPES measurements were carried out in the electron energy range 0.2-2.0 keV with two different analyzers (double-pass cylindrical mirror analyzer (DCMA), spherical sector analyzer (SSA)) and the use of Ni standard. The measured IMFPs were uncorrected for surface excitations and compared with those calculated from the TPP-2M and G-1 predictive formulae using Fano plots. Good agreement was found between the measured and the calculated electron IMFPs in SiC exhibiting different structural properties.

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Measured electron IMFPs for SiC

Krawczyk

Zommer

Kosinski

et al. 2006

Surface & Interface Analysis

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Studies of AuNi alloys by electron spectroscopies with the aid of the line shape analysis by the pattern recognition method

Lesiak¹,

Zemek²,

Jiřı́ček³

et al. 2006

Surf. Interface Anal.

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The spectrum of electrons elastically backscattered from the surface and within its vicinity reflects the probability of electron elastic backscattering on the surface atoms, quasi-elastic scattering and the inelastic scattering visible in the low energy side of the elastic peak. The method for investigating the processes of electron elastic backscattering on the surface atom is called the elastic peak electron spectroscopy (EPES).In the present work, AuNi alloys of different compositions are investigated using X-ray photoelectron spectroscopy (XPS) and the EPES method with the aid of the line shape analysis called the fuzzy k-nearest neighbour (fkNN) rule. The line shape analysis was found to be applicable for EPES spectroscopy. It allows distinguishing the surfaces exhibiting various surface roughness, texture and grain size, and quantifying the selected information depths. The quantitative results obtained from the XPS analysis and the EPES spectra line shape analysis indicated Au surface segregation with Au surface enriched profile. Quantitative discrepancies are discussed within the non-uniform concentration profiles of constituents due to sputter cleaning and annealing, different diffusion coefficients for Au and Ni, differences in the information depths sampled by XPS and EPES methods and differences in electron elastic backscattering cross-sections for Ni and Au.

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Transport properties of pristine and alloyed free standing ultrathin nanowires of noble metals

Kumar

Ahluwalia

2014

Journal of Alloys and Compounds

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Determination of the electron inelastic mean free path in some binary alloys for application in quantitative surface analysis

Cited by 7 publications

References 20 publications

Measured electron IMFPs for SiC

Measured electron IMFPs for SiC

Studies of AuNi alloys by electron spectroscopies with the aid of the line shape analysis by the pattern recognition method

Transport properties of pristine and alloyed free standing ultrathin nanowires of noble metals

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