2007
DOI: 10.5194/ars-5-115-2007
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Determination of the input impedance of RFID transponder antennas with novel measurement procedure using a modified on-wafer-prober

Abstract: Abstract. This paper shows a new method to determine the input impedance of RFID transponder antennas with a combination of on-wafer-prober and network analyzer. It is shown that the results are in a good agreement with FEM simulations (HFSS) for a large part of the examined antenna structures.

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Cited by 11 publications
(4 citation statements)
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“…The extension, which can be a SMA connector [12,13], a wafer probe [14], or other type of the structure, has two tips probing the feed of the tag antenna. Fig.…”
Section: Single-ended Probementioning
confidence: 99%
“…The extension, which can be a SMA connector [12,13], a wafer probe [14], or other type of the structure, has two tips probing the feed of the tag antenna. Fig.…”
Section: Single-ended Probementioning
confidence: 99%
“…There are several RFID Tag antenna characteristics measurement techniques in the literature [3239]. In [3638], very feasible, inexpensive technique for the measurement of the balance RFID tag antenna was proposed which is known as differential probe method.…”
Section: Resultsmentioning
confidence: 99%
“…There are several measurement techniques of the RFID tag antenna characteristics in the literature . In , very feasible, inexpensive technique for the measurement of the balance RFID tag antenna was proposed which is known as Differential Probe Method.…”
Section: Resultsmentioning
confidence: 99%