1993
DOI: 10.1021/j100110a030
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Determination of the optical properties of silicon/silica surfaces by means of ellipsometry, using different ambient media

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Cited by 199 publications
(211 citation statements)
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“…The influence of the silicon oxide layer is accounted for, using the methods suggested by Landgren and Jönsson. 40 All measurements were conducted at a wavelength of 401.5nm, with an incident angle of 67.87 • . The experiments were performed in situ at a temperature of 25 • C, using a 5mL trapezoid cuvette made of optical glass and fitted with a magnetic stirrer, rotating at a speed of 300 rpm.…”
Section: Methodsmentioning
confidence: 99%
“…The influence of the silicon oxide layer is accounted for, using the methods suggested by Landgren and Jönsson. 40 All measurements were conducted at a wavelength of 401.5nm, with an incident angle of 67.87 • . The experiments were performed in situ at a temperature of 25 • C, using a 5mL trapezoid cuvette made of optical glass and fitted with a magnetic stirrer, rotating at a speed of 300 rpm.…”
Section: Methodsmentioning
confidence: 99%
“…Next, the surface was vertically mounted into a glass trapezoid cuvette (Hellma, Germany) containing 5 ml of solution thermostated at 25°C and equipped with magnetic stirrer. Additional specification of the ellipsometer setup is described by Landgren and Jönsson [50]. In order to determine the refractive index of the gold surface, prior to each measurement, a twozone surface characterization in solution was carried out.…”
Section: Ellipsometrymentioning
confidence: 99%
“…The adsorption of HS-PG and of the lipoproteins was monitored by in situ ellipsometry, as detailed previously [19][20][21]. All measurements were carried out with an Optrel Multiskop (Optrel, Kleinmachnow, Germany) at 532 nm.…”
Section: Ellipsometry Measurementsmentioning
confidence: 99%