Determination of the valence band structure of an alkali phosphorus oxynitride glass: A synchrotron XPS study on LiPON

Schwöbel, André; Precht, Ruben; Motzko, Markus; Solano, M. A. Carrillo; Calvet, Wolfram; Hausbrand, René; Jaegermann, Wolfram

doi:10.1016/j.apsusc.2014.09.174

Cited by 17 publications

(13 citation statements)

References 26 publications

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“…On the other hand, the shoulder observed at higher binding energies corresponds to nitrogen bonded to three phosphorus atoms, >N-. The energy difference between doubly bonded (Nd) and triply bonded (Nt) nitrogen was fitted to be 1.5 eV, as reported before [5,43]. XPS peak position shifts observed in the samples are due to charging effects related to the electronically insulating nature of these oxides [42,44].…”

Section: Stability Of Deposited Films To Air Exposurementioning

confidence: 91%

Phosphate structure and lithium environments in lithium phosphorus oxynitride amorphous thin films

Solano

Dussauze

Vinatier

et al. 2015

Ionics

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International audienceLithium ion-conducting glasses attract wide interest for electrochemical applications like efficient energy storage devices. This work presents a structural study on involved bonding units, based on X-ray photoelectron spectroscopy and infrared spectroscopy, of lithium phosphorus oxide and oxynitride amorphous thin films prepared by RF magnetron sputtering. A thorough consideration of the mid- and far-infrared spectral regions demonstrated structural changes at the phosphate units and the lithium ion environments triggered by nitrogen incorporation and post-deposition thermal treatment. It was found that films prepared by sputtering in pure nitrogen atmosphere have about 75 % of their nitrogen atoms in sites doubly coordinated with phosphorus (P–N=P), and the rest in triply coordinated sites. It was shown also that nitrogen incorporation favors the stability of lithium ions, while annealing enhances ionic conductivity of the oxynitride films

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Section: Stability Of Deposited Films To Air Exposurementioning

confidence: 91%

Phosphate structure and lithium environments in lithium phosphorus oxynitride amorphous thin films

Solano

Dussauze

Vinatier

et al. 2015

Ionics

View full text Add to dashboard Cite

show abstract

“…The tunable photon energy at the synchrotron offers depth‐dependent information at buried interfaces unachievable with conventional XPS. [ 305–307 ] Hard XPS (known as HAXPES or HXPS) experiments operate at energy a few times higher than lab XPS. The high incident energy allows access to deeper core levels with additionally a larger penetration depth for bulk sensitivity (up to 50 nm).…”

Section: Interface‐sensitive Techniquesmentioning

confidence: 99%

“…SXPS was used to determine the valence band structure of LiPON solid‐state electrolyte commonly used in thin‐film batteries. [ 305 ] It was concluded that N 2p states are responsible for the top of the valence band. As a result, the N content in LiPON layers may affect the energy band alignment with cathode materials.…”

Section: Interface‐sensitive Techniquesmentioning

confidence: 99%

Interface Aspects in All‐Solid‐State Li‐Based Batteries Reviewed

Chen

Jiang

Zhou

et al. 2021

Advanced Energy Materials

101

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Extensive efforts have been made to improve the Li‐ionic conductivity of solid electrolytes (SE) for developing promising all‐solid‐state Li‐based batteries (ASSB). Recent studies suggest that minimizing the existing interface problems is even more important than maximizing the conductivity of SE. Interfaces are essential in ASSB, and their properties significantly influence the battery performance. Interface problems, arising from both physical and (electro)chemical material properties, can significantly inhibit the transport of electrons and Li‐ions in ASSB. Consequently, interface problems may result in interlayer formation, high impedances, immobilization of moveable Li‐ions, loss of active host sites available to accommodate Li‐ions, and Li‐dendrite formation, all causing significant storage capacity losses and ultimately battery failures. The characteristic differences of interfaces between liquid‐ and solid‐type Li‐based batteries are presented here. Interface types, interlayer origin, physical and chemical structures, properties, time evolution, complex interrelations between various factors, and promising interfacial tailoring approaches are reviewed. Furthermore, recent advances in the interface‐sensitive or depth‐resolved analytical tools that can provide mechanistic insights into the interlayer formation and strategies to tailor the interlayer formation, composition, and properties are discussed.

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“…It was found that the coexistence of different silane molecules can be achieved nondestructively by using energy and angle‐resolved SR–XPS. As another case of study, LiPON (lithium phosphorus oxynitride), as an ionic thin film battery, was studied by Schwöbel et al With respect to this fact that the ionic conductors should demonstrate very low electronic conductivity, it is important to study the valence band of these structures. Applying SR–XPS, it is possible to study the atomic orbital and valence band, in the depth of these multielemental structures.…”

Section: X‐ray Photoelectron Spectroscopymentioning

confidence: 99%

Review on applications of synchrotron‐based X‐ray techniques in materials characterization

2020

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Synchrotron radiation (SR), as a result of its high-intensity, brilliant, monochromatic, and collimated beams, is becoming one of the most crucial components of research in various fields of materials science such as nanomaterials, biomaterials, and energy materials. SR-based characterization methods can be employed to analyze different systems such as powders, thin films, and bulk forms having complex crystalline or amorphous structures. In this review, peculiarities of SR are briefly explained. Moreover, various techniques carried out utilizing this instrument for material characterization such as X-ray powder diffraction, grazing-incidence X-ray diffraction, small/ wide-angle X-ray scattering, X-ray absorption spectroscopy, different techniques of X-ray imaging, X-ray photoelectron spectroscopy, and X-ray microprobes/nanoprobes are presented. As a result, by shedding light on the advantages of SR and its superiority to the equivalent laboratory experiments, researchers are recommended to exploit the capabilities of this invaluable tool in their materials characterization.

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Determination of the valence band structure of an alkali phosphorus oxynitride glass: A synchrotron XPS study on LiPON

Cited by 17 publications

References 26 publications

Phosphate structure and lithium environments in lithium phosphorus oxynitride amorphous thin films

Phosphate structure and lithium environments in lithium phosphorus oxynitride amorphous thin films

Interface Aspects in All‐Solid‐State Li‐Based Batteries Reviewed

Review on applications of synchrotron‐based X‐ray techniques in materials characterization

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