Determination of Thermal and Elastic Coefficients of Optical Thin-Film Materials

Michel, Sébastien; Lemarquis, Frédéric; Lequime, Michel

doi:10.1364/oic.2007.wd4

Cited by 1 publication

(3 citation statements)

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“…This simulation allows us to conclude that the interferometer undergoes deformations a lot more than we expected (the slope of the difference between the peripheral and center channels are 20 times more than simulations predict). This result brings us to investigate with more attention the behavior of deformation due to CTE difference between materials, see reference [5].…”

Section: Measurements On An Optically Contacted Ule Fabry-perotmentioning

confidence: 99%

“…Besides, we decided to consider statistical noise to evaluate the consequences on the determination of the optical thickness of the cavity. Detailed results regarding this investigation are given in [5], however the main ones are recapitulated here:…”

Section: Generalities and First Approachmentioning

confidence: 99%

“…Thus, the measurement is very sensitive to the thermal deformations, which cause a problem of reference. A precise study is needed to have the best accuracy on the thermal expansion of thin film, as described in [5].…”

Section: Potential Applicationsmentioning

confidence: 99%

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Ultrafine measurements of the thermal shift of Fabry-Perot resonances

2008

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The wavelengths associated to the transmission peaks of a Fabry-Perot etalon are directly connected with its optical thickness. As a consequence, any change in the physical thickness or the refractive index of the cavity has a direct influence on the value of these specific wavelengths. This property can be used to determine the thermal characteristics, like the coefficient of thermal expansion or the thermo-optic coefficient, of some materials. However, to be efficient, this method needs a very high accuracy in the determination of these resonant wavelengths. We developed a dedicated measurement set-up, combining a tunable laser source around 850 nm and a high precision wavelength meter to determine with accuracy better than 0.2 pm the resonant wavelengths of a Fabry-Perot etalon. We use a temperature stabilized chamber to avoid temperature fluctuations or, on the contrary, to apply a deterministic temperature change at the cavity level. We describe the structure of our bench and present the results obtained on BK7 windows as well as on an optically contacted ULE Fabry-Perot with silver coatings.

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Section: Measurements On An Optically Contacted Ule Fabry-perotmentioning

confidence: 99%

Section: Generalities and First Approachmentioning

confidence: 99%