2017
DOI: 10.1021/acs.jpcc.7b01924
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Determining Material-Specific Morphology of Bulk-Heterojunction Organic Solar Cells Using AFM Phase Imaging

Abstract: A technique for determining the materialspecific morphology of a polymer−fullerene blend is presented. This technique is applied to solution processed bulk-heterojunction organic solar cells with different weight ratios of polymer−fullerene blend using the PTB7:PCBM material system. Optical and electrical characterizations show that the light absorption increases for larger polymer (PTB7) content, while the fill factor of the fabricated solar cells is improved for larger fullerene (PCBM) content. The materials… Show more

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Cited by 17 publications
(16 citation statements)
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“…To observe the morphology changes of smithsonite before and after sulfidization, AFM height and phase imaging were used. In the AFM phase images, the presence of different materials at the surface of the sample was indicated by differences in contrast, providing additional information; hence, phase imaging is suitable for such a study [27,28].…”
Section: Afm Observationmentioning
confidence: 99%
“…To observe the morphology changes of smithsonite before and after sulfidization, AFM height and phase imaging were used. In the AFM phase images, the presence of different materials at the surface of the sample was indicated by differences in contrast, providing additional information; hence, phase imaging is suitable for such a study [27,28].…”
Section: Afm Observationmentioning
confidence: 99%
“…The relatively high PCBM content in the blend can lead to an imbalanced electron‐to‐hole mobility ratio, making difficult to transport holes due to large domains . Reported µ value through SCLC measurements of PTB7 yielded the value 5.9 × 10 −4 cm 2 V −1 s −1 , for [70]PCBM is reported 1 ×10 −3 cm 2 V −1 s −1 and for the blend (PTB7:[70]PCBM) is in the range of 3.2 × 10 −4 − 2 × 10 −4 cm 2 V −1 s −1 ; from pc‐AFM local J – V plot (Figure a) and by using Equation , a mobility µ value of 1.69 × 10 −4 cm 2 V −1 s −1 for the PTB7:[70]PCBM blend is determined, which is in good agreement with that one reported in the literature. Figure b shows a typical J – V plot of OPVs devices under the AM1.5 illumination condition .…”
Section: Resultsmentioning
confidence: 93%
“…The corresponding potentials of buried layers were imaged into their respective contact potential difference (CPD) levels by KPFM scanning [ 17 ]. It should be noted that boundary of each layer can only be assigned by the phase image; thus, the dark line between the PCDTBT:PCBM BHJ layer and anode PEDOS:PSS layer in KPFM image is not an interface of these two layers [ 18 ]. Depth profile of CPD can be obtained by row-wise averaging of measured KPFM signals of Fig.…”
Section: Resultsmentioning
confidence: 99%