2009
DOI: 10.1557/jmr.2009.0144
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Determining the elastic modulus and hardness of an ultra-thin film on a substrate using nanoindentation

Abstract: The Harvard community has made this article openly available. Please share how this access benefits you. Your story matters. Abstract -A data analysis procedure has been developed to estimate the contact area in an elasto-plastic indentation of a thin film bonded to a substrate. The procedure can be used to derive the elastic modulus and hardness of the film from the indentation load, displacement, and contact stiffness data at indentation depths that are a significant fraction of the film thickness. The analy… Show more

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Cited by 166 publications
(102 citation statements)
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References 29 publications
(64 reference statements)
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“…In this function, the maximum load was varied from 80 to 1000 μN in ten steps while the application, removal and dwell times were fixed in 1s. The results, obtained using the Oliver and Pharr method 15 , correspond to the average of 15 indentations conducted for each one of the ten applied force. Figure 2 shows the deposition rate of the films as a function of the oxygen concentration in the plasma.…”
Section: Film Characterizationmentioning
confidence: 99%
“…In this function, the maximum load was varied from 80 to 1000 μN in ten steps while the application, removal and dwell times were fixed in 1s. The results, obtained using the Oliver and Pharr method 15 , correspond to the average of 15 indentations conducted for each one of the ten applied force. Figure 2 shows the deposition rate of the films as a function of the oxygen concentration in the plasma.…”
Section: Film Characterizationmentioning
confidence: 99%
“…It is known that the presence of residual stress a ects the overall indentation response of material and, hence, the measured hardness and modulus. Tensile residual stress reduces the hardness, and di erent levels of residual stress in a lm lead to di erent values of hardness [19]. Therefore, we expected more decrease on the harness of thinner lm, but it should be considered that the hardness of thinner lms is limited to the substrate hardness.…”
Section: Resultsmentioning
confidence: 87%
“…This is because the elastic eld under the indenter is not con ned to the lm itself and extends into the substrate. At very shallow depths, the indentation moduli are equal to the true indentation moduli of the lms, but they change quickly with increasing indentation depth and approach the substrate indentation modulus [18,19].…”
Section: Resultsmentioning
confidence: 99%
“…The method proposed next is essentially based on similar concepts as Oliver-Pharr (9) , Doerner-Nix (7) and also with Li and Vlassak (16) . An important point is that the initial slope of the unloading curve for a plastic material should be equal to the tangent at the loaddisplacement curve of an elastic material with the same Young's modulus, if the corresponding contact area are the same (Fig.…”
Section: Methodsmentioning
confidence: 99%
“…In the first series of examples the materials are elastic and the identification is done from the loading curve. In the second series of examples the materials are elastoplastic and the identification is done on the unloading curve using a similar strategy as presented in the closed-form solution of Doerner-Nix, Oliver-Pharr or as presented in the work of Li and Vlassak (16) based on the analytical solution of the contact problem of axisymmetric indenter on a layered elastic half-space.…”
Section: Journal Of Solid Mechanics and Materials Engineeringmentioning
confidence: 99%