2015
DOI: 10.1016/j.solmat.2014.11.032
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Determining the photocurrent of individual cells within an organic solar module by LBIC and the filtering approach: Experiments and simulations

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Cited by 7 publications
(4 citation statements)
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“…420 To solve these problems, Song et al 178,420 reported the study of the photocurrent collection nonuniformities in the individual cells of perovskite/Si TSCs (Figure 62a) via the light beam induced current (LBIC) method, which has been used for identifying processing defects in cells and modules by spatially resolving the photocurrent generation and collection. 421,422 Laser light at different wavelengths (532 and 1064 nm) and at a relatively low power density (∼800 mW cm −2 , to avoid possible illumination damage on the PSC) is used to excite charge carriers in the subcells. The photogenerated current is calibrated for EQE to construct LBIC mapping.…”
Section: Which Tsc Is the Best?mentioning
confidence: 99%
“…420 To solve these problems, Song et al 178,420 reported the study of the photocurrent collection nonuniformities in the individual cells of perovskite/Si TSCs (Figure 62a) via the light beam induced current (LBIC) method, which has been used for identifying processing defects in cells and modules by spatially resolving the photocurrent generation and collection. 421,422 Laser light at different wavelengths (532 and 1064 nm) and at a relatively low power density (∼800 mW cm −2 , to avoid possible illumination damage on the PSC) is used to excite charge carriers in the subcells. The photogenerated current is calibrated for EQE to construct LBIC mapping.…”
Section: Which Tsc Is the Best?mentioning
confidence: 99%
“…Light beam induced current (LBIC) imaging has been demonstrated as a versatile method for identifying processing defects in cells and modules by spatially resolving the photocurrent generation and collection. In the present contribution, we use LBIC to probe photocurrent nonuniformities in the individual subcells of perovskite/Si tandem solar cells. By using laser light at different wavelengths in combination with background light bias, we can identify processing defects and efficiency-limiting regions and provide in-depth quantitative analysis of current generation and transport in the individual subcells.…”
mentioning
confidence: 99%
“…Electrical characterization based on current-voltage (IV) measurement can provide information on the overall functionality of the optoelectronic devices and provide information about the malfunction of the device but not the location of the problem [11]. Electro-optical imaging techniques such as light beam induced current (LBIC) mapping, dark lock-in thermography (DLIT), electroluminescense (EL) imaging, and photoluminescence (PL) imaging are able to reveal the details on registration, defects, particles, shunts and processing variations affecting electrical functionality [12][13][14][15]. These techniques have also proven useful for inline inspection, monitoring and process control [12,[16][17][18][19].…”
Section: Introductionmentioning
confidence: 99%