2021
DOI: 10.48550/arxiv.2101.09946
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Determining the Proximity Effect Induced Magnetic Moment in Graphene by Polarized Neutron Reflectivity and X-ray Magnetic Circular Dichroism

Abstract: We report the magnitude of the induced magnetic moment in CVD-grown epitaxial and rotateddomain graphene as a result of the proximity effect in the vicinity of the ferromagnetic substrates Co and Ni, using polarised neutron reflectivity (PNR). Although rotated-domain graphene is known to interact weakly with the ferromagnetic underlayer in comparison with the epitaxial graphene, the PNR results indicate an induced magnetic moment of ∼ 0.57 µ B /C atom at 10 K for both structures. The origin of the induced magn… Show more

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Cited by 2 publications
(2 citation statements)
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References 52 publications
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“…This work will not introduce Bayesian or sampling methods for neutron and X-ray reflectometry analysis. For those unfamiliar with these techniques, we suggest the work of Sivia and co-workers (Sivia & Webster, 1998;Sivia & Skelling, 2006) and more recent work focusing on reflectometry analysis (Hughes et al, 2019;McCluskey et al, 2020;Nelson & Prescott, 2019;Aboljadayel et al, 2021). We hope that this paper will inform best practices in data sharing from reflectometry analysis and inspire software developers to enable these to be accessed easily by the user.…”
Section: Introductionmentioning
confidence: 96%
“…This work will not introduce Bayesian or sampling methods for neutron and X-ray reflectometry analysis. For those unfamiliar with these techniques, we suggest the work of Sivia and co-workers (Sivia & Webster, 1998;Sivia & Skelling, 2006) and more recent work focusing on reflectometry analysis (Hughes et al, 2019;McCluskey et al, 2020;Nelson & Prescott, 2019;Aboljadayel et al, 2021). We hope that this paper will inform best practices in data sharing from reflectometry analysis and inspire software developers to enable these to be accessed easily by the user.…”
Section: Introductionmentioning
confidence: 96%
“…This work will not introduce Bayesian or sampling methods for neutron and X-ray reflectometry analysis. For those unfamiliar with these techniques, we suggest the work of Sivia and co-workers [5,15] and more recent work focusing on reflectometry analysis [7,14,16,17]. We hope that this work will inform best practices in data sharing from reflectometry analysis and inspire software developers to enable these to be accessed easily by the user.…”
Section: Introductionmentioning
confidence: 99%