Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss

Wu, Chien‐Wei; Wang, Zih‐Huei

doi:10.1080/00207543.2016.1244360

Cited by 46 publications

(8 citation statements)

References 44 publications

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“…In Sections 3 and 4, we will first briefly review and discuss MDS plans based on the C pmk index (abbr. C pmk ‐MDS plans) 13 , and then we will establish the variables AMDS plans based on the C pmk index (abbr. C pmk ‐AMDS plans).…”

Section: Process Capability Indicesmentioning

confidence: 99%

“…Wu et al 12 introduced the variables MDS plans based on the sample information of the PCI C pm , which incorporates the producer's process loss and the consumer's demanded specification requirements. Wu and Wang 13 designed the variables MDS plans for lot sentencing based on the advanced PCI C pmk , which was developed by combining the merits of the yield‐based index and the loss‐based index.…”

Section: Introductionmentioning

confidence: 99%

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Process‐capability‐qualified adjustable multiple‐dependent‐state sampling plan for a long‐term supplier–buyer relationship

Wang

Hsu

et al. 2020

Quality & Reliability Eng

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Acceptance sampling plan is widely used for the inspections of incoming or outgoing products to provide the producer and the consumer a general benchmark for lot sentencing. To reduce the inspection cost, the multiple‐dependent‐state (MDS) plan that takes account of the preceding lots' quality history into the current lot disposition has been proposed. However, recent studies overlook the fact that the MDS plan's performance needed to reach target compliance decreases with an increase in the number of preceding lots considered. This unawareness makes the MDS plan fall into a conflictive situation. To overcome the drawback of the MDS plan, in this paper, we introduce a modified MDS plan to accommodate an adjustable mechanism, called adjustable MDS (AMDS) sampling plans. The presented AMDS plans are designed on the basis of the advanced process capability index, which is cognizant of both the process yield and the process loss. This established process‐capability‐qualified AMDS plan efficiently solves the conflictive situation of the MDS plan when encompassing more preceding lots in the lot‐disposition decision. Notably, its efficacy has been shown on high improvements in terms of the required sample size for the inspection, the discriminatory power, and the average run length for lot sentencing.

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Section: Process Capability Indicesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Process‐capability‐qualified adjustable multiple‐dependent‐state sampling plan for a long‐term supplier–buyer relationship

Wang

Hsu

et al. 2020

Quality & Reliability Eng

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“…This process capability information measures the effectiveness of the production process. Since the use of the PCI and acceptance sampling plans became popular, numerous papers have combined the two to develop variables in sampling plans for lot sentencing [4][5][6][7][8][9][10][11][12][13][14]. These papers are designed for different purposes 2 of 12 or sampling skills.…”

Section: Introductionmentioning

confidence: 99%

“…These papers are designed for different purposes 2 of 12 or sampling skills. Yen et al [4,12], Aslam et al [6,13], Lee et al [9], and Wu and Wang [11] used PCI to develop variables sampling plans which consider the quality of ongoing lot and preceding lots for lot sentencing. Wu and Liu [5] designed a single variables sampling plan based on process yield index.…”

Section: Introductionmentioning

confidence: 99%

A Rectifying Acceptance Sampling Plan Based on the Process Capability Index

Yen

Lee

et al. 2020

Mathematics

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The acceptance sampling plan and process capability index (PCI) are critical decision tools for quality control. Recently, numerous research papers have examined the acceptance sampling plan in combination with the PCI. However, most of these papers have not considered the aspect of rectifying inspections. In this paper, we propose a quality cost model of repetitive sampling to develop a rectifying acceptance sampling plan based on the one-sided PCI. This proposed model minimizes the total quality cost (TQC) of sentencing one lot, including inspection cost, internal failure cost, and external failure cost. In addition, sensitivity analysis is conducted to investigate the behavior of relevant parameters against TQC. To demonstrate the advantages of the proposed methodology, a comparison is implemented with the existing rectifying sampling plan in terms of TQC and average outgoing quality limit. This comparison reveals that our proposed methodology exhibits superior performance.

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“…For the attribute MDS sampling plan, one may refer to Vaerst, 15 Soundararajan and Vijayaraghavan, 16 Govindaraju and Subramani, 17 Subramani and Haridoss, 18 Balamurali et al 19,20 For variables inspection, one may refer to Balamurali and Jun, 21 Aslam et al 22 and Wu and Wang. 23 Nowadays, MDS sampling is also applied for designing the control charts (see, for example, Aslam et al 24,25 ).…”

Section: Introductionmentioning

confidence: 99%

An Attribute np Control Chart for Monitoring Mean Life Using Multiple Deferred State Sampling Based on Truncated Life Tests

Balamurali

Jeyadurga

2019

Int. J. Rel. Qual. Saf. Eng.

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In this paper, we design an attribute [Formula: see text] control chart for monitoring the mean life of the product where the lifetime follows the Pareto distribution of the second kind. The lifetime of the product is determined by time truncated life test and the multiple deferred state sampling is used to declare the status of the manufacturing process. Control limit coefficients and multiple deferred state sampling parameters such as sample size and number of successive subgroups required to declare the state of the process are determined such that the in-control average run length is as near as possible to the target average run length. Out-of-control average run lengths are calculated for the determined parameters using various shift constants. The performance of the chart is compared with other existing chart in terms of average run length.

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Developing a variables multiple dependent state sampling plan with simultaneous consideration of process yield and quality loss

Cited by 46 publications

References 44 publications

Process‐capability‐qualified adjustable multiple‐dependent‐state sampling plan for a long‐term supplier–buyer relationship

Process‐capability‐qualified adjustable multiple‐dependent‐state sampling plan for a long‐term supplier–buyer relationship

A Rectifying Acceptance Sampling Plan Based on the Process Capability Index

An Attribute np Control Chart for Monitoring Mean Life Using Multiple Deferred State Sampling Based on Truncated Life Tests

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