“…In contrast, Eu 3+ emission exhibits sharp red lines and is considered less attractive in this context. Similarly, Cr 3+ emits near-infrared light, while Cr 4+ emits shortwave infrared light. , XAS and XPS are valuable techniques in X-ray spectroscopy, but they have distinct characteristics. XAS provides information about the average electronic structure of a material with limited depth sensitivity, while XPS is surface-sensitive, typically probing within a few nanometers.…”