Development and characterization of a laser-plasma soft X-ray source for contact microscopy

Ayele, Mesfin Getachew; Wachulak, P.; Czwartos, Joanna; Adjei, Daniel; Bartnik, A.; Węgrzyński, Łukasz; Szczurek, M.; Pı́na, L.; Fiedorowicz, Henryk

doi:10.1016/j.nimb.2017.03.082

Cited by 20 publications

(20 citation statements)

References 37 publications

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“…The photon yield was measured using AXUV 100 (Opto Diode Corporation, Camarillo, CA, USA) photodiode. More details about the source and the system were reported in [12]. gap filled with He at 770 Torr gas pressure had, on average, ~85% transmission in the wavelength range from 3-5 nm, while air at 760 Torr pressure ~12-15%.…”

Section: Characterization Of Soft X-ray Contact Microscope (Sxcm) Systemmentioning

confidence: 99%

“…The photon yield was measured using AXUV 100 (Opto Diode Corporation, Camarillo, CA, USA) photodiode. More details about the source and the system were reported in [12].…”

Section: Characterization Of Soft X-ray Contact Microscope (Sxcm) Systemmentioning

confidence: 99%

“…The system was first developed for dried samples [12,13], showing its applicability potential and the need to optimise soft X-ray (SXR) conditions to visualize the internal cell structures in the thickness and morphological complexity-dependent manner. Currently, the system can imagine living cells in the He-filled environmental chamber using an additional silicon nitride (Si 3 N 4 ) membrane, allowing moisture underneath the membrane during the entire exposure.…”

Section: Introductionmentioning

confidence: 99%

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Imaging of Cell Structures Using Optimized Soft X-ray Contact Microscopy

et al. 2020

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This work is to study the relationship between the exposure conditions and the quality of cell imaging with soft X-ray contact microscopy (SXCM). It is a crucial step in the efficient visualization of cell structures. Three different human cell lines: DU145 prostate carcinoma cells, HCC38 breast cancer cells, and Poietics mesenchymal stem cells were used to establish the optimal exposure conditions in SXCM. The image quality depended on the soft X-ray (SXR) absorbed energy and photoresist development conditions. At lower SXR energy (200 or 400 SXR pulses), sharp cell edges, membrane projections, and cell–cell connections were visible. In contrast, higher energy (600 or 800 SXR pulses) allowed observation of the cytoskeleton and the nucleus in a cell type-dependent manner (the influence of cell thickness and internal complexity was noted).

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Section: Characterization Of Soft X-ray Contact Microscope (Sxcm) Systemmentioning

confidence: 99%

“…The photon yield was measured using AXUV 100 (Opto Diode Corporation, Camarillo, CA, USA) photodiode. More details about the source and the system were reported in [12].…”

Section: Characterization Of Soft X-ray Contact Microscope (Sxcm) Systemmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Imaging of Cell Structures Using Optimized Soft X-ray Contact Microscopy

et al. 2020

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“…As can be observed, structures with sizes below 100 nm are clearly visible. More details about this work can be found in [40,41]. Another sample used in the preliminary contact microscopy experiments was epidermal cell (Keratinocyte), as depicted in Figure 5c,d.…”

Section: Sxr Contact Microscopy Imagingmentioning

confidence: 99%

“…As can be observed, structures with sizes below 100 nm are clearly visible. More details about this work can be found in [40,41].…”

Section: Sxr Contact Microscopy Imagingmentioning

confidence: 99%

Bioimaging Using Full Field and Contact EUV and SXR Microscopes with Nanometer Spatial Resolution

et al. 2017

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We present our recent results, related to nanoscale imaging in the extreme ultraviolet (EUV) and soft X-ray (SXR) spectral ranges and demonstrate three novel imaging systems recently developed for the purpose of obtaining high spatial resolution images of nanoscale objects with the EUV and SXR radiations. All the systems are based on laser-plasma EUV and SXR sources, employing a double stream gas puff target. The EUV and SXR full field microscopes-operating at 13.8 nm and 2.88 nm wavelengths, respectively-are currently capable of imaging nanostructures with a sub-50 nm spatial resolution with relatively short (seconds) exposure times. The third system is a SXR contact microscope, operating in the "water-window" spectral range (2.3-4.4 nm wavelength), to produce an imprint of the internal structure of the investigated object in a thin surface layer of SXR light sensitive poly(methyl methacrylate) photoresist. The development of such compact imaging systems is essential to the new research related to biological science, material science, and nanotechnology applications in the near future. Applications of all the microscopes for studies of biological samples including carcinoma cells, diatoms, and neurons are presented. Details about the sources, the microscopes, as well as the imaging results for various objects will be shown and discussed.

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