2022
DOI: 10.1002/adem.202201021
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Development and Validation of a Calculation Routine for the Precise Determination of Pulse Overlap and Accumulated Fluence in Pulsed Laser Surface Treatment

Abstract: In laser material processing, a variety of parameters like pulse fluence, total dose, step size, and pulse-to-pulse overlap are used to define and compare laser processes. Of these parameters, the pulse-to-pulse overlap can be the hardest to access as it is not implemented directly but instead depends on the spot diameter, its shape, and the respective scanning path that is used to cover the surface. This article shows that existing calculation routes overestimate the actual overlap by up to 21%. A novel calcu… Show more

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Cited by 6 publications
(5 citation statements)
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“…Depending on the used pulse-to-pulse distance as well as the laser beam diameter 2 ω 0 , different pulse-to-pulse overlaps can be achieved as described by the Eq. ( 1 ) 41 :
Figure 1 ( a ) DLIP configuration and ( b ) ITO patterning strategy.
…”
Section: Methodsmentioning
confidence: 99%
“…Depending on the used pulse-to-pulse distance as well as the laser beam diameter 2 ω 0 , different pulse-to-pulse overlaps can be achieved as described by the Eq. ( 1 ) 41 :
Figure 1 ( a ) DLIP configuration and ( b ) ITO patterning strategy.
…”
Section: Methodsmentioning
confidence: 99%
“…The employed patterning strategy is illustrated in Figure 1b. Depending on the used pulse-to-pulse distance 𝑝 d as well as the laser beam diameter 2 0 , different pulse-to-pulse overlaps (𝑂𝑉) can be achieved as described by the equation (1) 41 :…”
Section: Methodsmentioning
confidence: 99%
“…Wire‐cut electrical discharge machining (EDM) was used to cut 5×5 mm samples out of a 1 mm thick titanium sheet (HMW Hanauer GmbH; 99.995 wt.%). The resulting samples were mirror‐polished following a multi‐step routine described in detail in a previous work [49] …”
Section: Experimental Section/methodsmentioning
confidence: 99%
“…The process parameters required to obtain the desired sample characteristics were calculated using a routine developed and reported in previous work. [49] While the line patterns were produced in a single process step with two beams, for the cross patterns two perpendicular line patterns each with half the total number of pulses were overlapped. The surfaces without an interference pattern were produced by blocking all but one beam and scanning the surface with a single beam.…”
Section: Sample Preparationmentioning
confidence: 99%
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