“…However, for other solutions it could be beneficial to reduce the SEY even further in order to suppress reflected, backscattered, and secondary electrons that could potentially generate background noise or deteriorate the measured signal, as for example in electron collectors, for the measurement of low electron currents in ultra-high vacuum (UHV) or for ionization based pressure gauges. [18,19] The material parameters that influence the electron yield are numerous. Since the emitted electrons are generated in a depth of a few nanometers, it is determined by the properties of the near-surface region of the material, such as the degree of oxidation of a metal, [20] the existence of adsorbates or surface impurities, or in general the surface chemical composition.…”