1982
DOI: 10.1143/jjap.21.1342
|View full text |Cite
|
Sign up to set email alerts
|

Development of a Laboratory EXAFS Facility and Its Application to Amorphous GeSe Semiconductors

Abstract: A new type of X-ray spectrometer and detector system for performing extended X-ray absorption fine structure measurements in the laboratory has been developed. The spectrometer is equipped with an asymmetrically-cut flat crystal monochromator in the magnifying mode and converts the energy dispersion to position dispersion using a position-sensitive detector. Two advantages of this apparatus are that it has no moving parts and that it makes the X-ray path shorter. The application of the spectrometer to amorphou… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
8
0

Year Published

1984
1984
2020
2020

Publication Types

Select...
6
2
1

Relationship

0
9

Authors

Journals

citations
Cited by 41 publications
(8 citation statements)
references
References 19 publications
0
8
0
Order By: Relevance
“…They use HAPG, Highly Annealed Pyrolitic Graphite, which is a recently developed type of pyrolitic graphite, but with lower mosaicity needed for high spectral resolving power. This configuration is compared to the results from other authors [94,123,[210][211][212][213][214] and they find the HAPG spectrometer to have a higher efficiency and better resolving power. They report a resolving power of E=DE % 2000, being significantly lower that what can be achieved with synchrotron based techniques.…”
Section: Laboratory Based Von Hamos Type Spectrometersmentioning
confidence: 86%
“…They use HAPG, Highly Annealed Pyrolitic Graphite, which is a recently developed type of pyrolitic graphite, but with lower mosaicity needed for high spectral resolving power. This configuration is compared to the results from other authors [94,123,[210][211][212][213][214] and they find the HAPG spectrometer to have a higher efficiency and better resolving power. They report a resolving power of E=DE % 2000, being significantly lower that what can be achieved with synchrotron based techniques.…”
Section: Laboratory Based Von Hamos Type Spectrometersmentioning
confidence: 86%
“…To eliminate these disadvantages we have utilized a dispersive method for EXAFS measurements. [17,18] Some of the most important advantages of this approach are: 1) The entire EXAFS spectrum of interest is recorded simultaneously. Therefore, fluctuations in the incident X-ray beam intensity do not influence the quality of the EXAFS spectrum.…”
Section: Time-resolved Exafsmentioning
confidence: 99%
“…To improve the resolution over symmetric reflection, the asymmetric reflection arrangement of Fig. 3 was used (Maeda, Terauchi, Tanabe, Kamijo, Hida & Kawamura, 1982) with the advantage that a given energy range is spread out further in space. This reduces the effect of the PSD on the energy resolution.…”
Section: B Reflection Geometrymentioning
confidence: 99%