X-ray diffraction was recognized from the early days as highly sensitive to atomic displacements. Indeed structural crystallography has been very successful in locating with great precision the position of atoms within an individual unit cell. In disordered systems it is the average structure and fluctuations about it that may be determined. In the field of mechanics diffraction may thus be used to evaluate elastic displacement fields. In this short overview we give examples from recent work where x-ray diffraction has been used to investigate average strains in lines, films or multilayers. In small objects the proximity of surfaces or interfaces may create very inhomogeneous displacement fields. X-ray scattering is again one of the best methods to determine such distributions. The need to characterize displacement fields in nanostructures together with the advent of third generation synchrotron radiation sources has generated new and powerful methods (anomalous diffraction, coherent diffraction, microdiffraction, …). We review some of the recent and promising results in the field of strain measurements in small dimensions via X-ray diffraction.
INTRODUCTIONSince the beginning of the nineties condensed matter physics has been increasingly concerned with properties of nm size objects. This trend is not simply a consequence of the steady miniaturization in electron devices [1]. It is also a result of fundamental discoveries, which show that new physical (magnetic, electronic, mechanical, …) properties appear at this scale. The search for specific size effects on physical properties should not shadow the influence of extremely high elastic strains inherent to these scales. Indeed it is now well established that materials in small dimensions [2] can sustain extremely high elastic strains. X-ray diffraction (XRD) has been recognized from the very early days [3,4] as a very sensitive tool to investigate lattice spacings and thus displacement fields. Homogeneous strains can be determined in a straightforward manner in ultrathin layers using synchrotron radiation. Strain fields are, however, Mater. Res. Soc. Symp. Proc. Vol. 840