In this study, a HfSiO
x
deposition technique is described that takes advantage of the multilayer adsorption of Si(OC2H5)4 (TEOS) and Hf(
t
OC4H9)4 (HTB), followed by the hydrolysis of all of the layers in liquid water. A thickness distribution better than ±3% and a uniform Si:Hf ratio over the 4-in. wafer were achieved using this deposition technique. The n-type metal–insulator–semiconductor field-effect transistor (MISFET) incorporating the HfSiO
x
film exhibited well-behaved capacitance–voltage characteristics. The channel mobility of 81% compared well to the universal curve at an effective field of 0.8 MV cm-1.