2015
DOI: 10.1016/j.rcim.2015.01.005
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Development of cloud-based automatic virtual metrology system for semiconductor industry

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Cited by 23 publications
(5 citation statements)
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“…The full cloud VM architecture places every possible component in the cloud, including the VM algorithm. The only part that remains on the machine is the data collection device (Huang et al 2015). Adding VM in a server dramatically increases the server's resistance to software failure thanks to the easy replacement of virtual machines; computational power can also easily be higher.…”
Section: Fab-wide Architecturementioning
confidence: 99%
“…The full cloud VM architecture places every possible component in the cloud, including the VM algorithm. The only part that remains on the machine is the data collection device (Huang et al 2015). Adding VM in a server dramatically increases the server's resistance to software failure thanks to the easy replacement of virtual machines; computational power can also easily be higher.…”
Section: Fab-wide Architecturementioning
confidence: 99%
“…Another promising technology is cloud computing, an emerging trend well suitable for scenarios where computational power, accessibility, agility and scalability are necessary. The extension of cloud computing to industry results in the concept of cloud-based manufacturing, a vital element for IoT and cyber-physical systems (Huang et al, 2015). According to Mell et al (2011), cloud computing must present the following key characteristics:…”
Section: Predictive Maintenance Systemsmentioning
confidence: 99%
“…To bridge the gap between direct sensing and indirect sensing, virtual sensing, as a complement to physical sensing, has emerged as a viable, noninvasive, and cost effective method to infer difficult-to-measure or expensive-to-measure parameters in dynamic systems based on computational models [22]. It has been investigated for active noise and vibration control [23], industrial process control [24], building operation optimization [25], lead-through robot programming [26], product quality of semiconductor industry [27], and tool condition monitoring [28,29].…”
Section: Introductionmentioning
confidence: 99%