2016
DOI: 10.5571/syntheng.9.4_213
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Development of EUPS for analyzing electronic states of topmost atomic layer

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Cited by 2 publications
(3 citation statements)
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“…S10 †). Further, the suppression of the Cl defects on the surface of the ux sample was supported by extreme UV-excited photoelectron spectroscopy (EUPS) measurement [36][37][38] (Fig. S11 †).…”
Section: Properties Of the Particles Prepared Via The Ux Methodsmentioning
confidence: 95%
“…S10 †). Further, the suppression of the Cl defects on the surface of the ux sample was supported by extreme UV-excited photoelectron spectroscopy (EUPS) measurement [36][37][38] (Fig. S11 †).…”
Section: Properties Of the Particles Prepared Via The Ux Methodsmentioning
confidence: 95%
“…The Rh 4d and Ce 4f valence band spectra were measured using EUPS, which was developed at the National Institute of Advanced Industrial Science and Technology (AIST, Tokyo, Japan). During EUPS, a sample was excited for 3 ns using a 4.86 nm (255 eV) pulse of extreme ultraviolet light emitted by laser-produced plasma, and the photoelectron spectrum was analyzed using a time-of-flight (TOF) analyzer . During TOF analysis, all electrons, regardless of their energies, are detected based on one-shot excitation, yielding a spectrum over the entire energy range in principle.…”
Section: Methodsmentioning
confidence: 99%
“…During EUPS, a sample was excited for 3 ns using a 4.86 nm (255 eV) pulse of extreme ultraviolet light emitted by laser-produced plasma, and the photoelectron spectrum was analyzed using a time-of-flight (TOF) analyzer. 18 During TOF analysis, all electrons, regardless of their energies, are detected based on one-shot excitation, yielding a spectrum over the entire energy range in principle. Signals based on multishot excitation are accumulated to reduce noise.…”
Section: ■ Introductionmentioning
confidence: 99%