2017
DOI: 10.1007/s10854-017-6953-z
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Development of extraction techniques for dielectric constant from free-space measured S-parameters between 50 and 170 GHz

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Cited by 21 publications
(9 citation statements)
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“…Microwave spectroscopy systems, which may be an alternative method, have been performed in many application areas such as security or military. Free space measurement (FSM) method especially offers the possibility of especially non-destructive and non-contact measurements, characterization of solid-liquid-powder materials, measuring solid materials except very small ones, and without preparing sample 1,2 .…”
Section: Introductionmentioning
confidence: 99%
“…Microwave spectroscopy systems, which may be an alternative method, have been performed in many application areas such as security or military. Free space measurement (FSM) method especially offers the possibility of especially non-destructive and non-contact measurements, characterization of solid-liquid-powder materials, measuring solid materials except very small ones, and without preparing sample 1,2 .…”
Section: Introductionmentioning
confidence: 99%
“…The geometrical structures in the simulation environment and their electromagnetic properties (such as permittivity and conductivity) influence the propagation paths and the received power. The electromagnetic characteristics of some common indoor office materials were determined as a result of material measurements in high frequencies 32‐36 . Moreover, even humidity and temperature of the environment are able to influence the propagation paths and received power.…”
Section: Ray‐trace Based Campaignmentioning
confidence: 99%
“…The factors, such as measured frequency range, the expected value of the permittivity, required measurement accuracy, properties of the material (homogeneous, isotropic), and form of the material (solid, liquid, and gas), must be taken into consideration during the method determination. In addition, conditions such as sample size constraints, temperature, contact/noncontact measurement, and destructive/nondestructive measurement must be considered [12,13].…”
Section: Electrical and Electronic Properties Of Materialsmentioning
confidence: 99%